Marko Matijevic

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Nurtingen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Particle beam system and method for operating a particle beam system
- Patent number 10,984,983
- Issue date Apr 20, 2021
- Carl Zeiss Microscopy GmbH
- Björn Gamm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 9,543,115
- Issue date Jan 10, 2017
- Carl Zeiss Microscopy GmbH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase contrast electron microscope
- Patent number 8,330,105
- Issue date Dec 11, 2012
- Carl Zeiss NTS GmbH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Grant
Phase contrast electron microscope
- Patent number 8,039,796
- Issue date Oct 18, 2011
- Carl Zeizz NTS GmbH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Grant
Phase contrast electron microscope
- Patent number 7,741,602
- Issue date Jun 22, 2010
- Carl Zeiss NTS GmbH
- Gerd Benner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE BEAM SYSTEM
- Publication number 20200185191
- Publication date Jun 11, 2020
- CARL ZEISS MICROSCOPY GMBH
- Björn Gamm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20150144787
- Publication date May 28, 2015
- CARL ZEISS MICROSCOPY GMBH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE CONTRAST ELECTRON MICROSCOPE
- Publication number 20120049062
- Publication date Mar 1, 2012
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Application
Phase contrast electron microscope
- Publication number 20100181481
- Publication date Jul 22, 2010
- Carl Zeiss NTS GmbH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Application
Phase contrast electron microscope
- Publication number 20070284528
- Publication date Dec 13, 2007
- Gerd Benner
- G01 - MEASURING TESTING