Markus B. Raschke

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Boulder, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for scanning probe sample property measurement...
- Patent number 11,994,533
- Issue date May 28, 2024
- The Regents of the University of Colorado, a Body Corporate
- Rafael Piestun
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of physical property measurement using a probe...
- Patent number 9,052,336
- Issue date Jun 9, 2015
- Bruker Nano, Inc.
- Markus B. Raschke
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of physical property measurement using a probe...
- Patent number 8,881,311
- Issue date Nov 4, 2014
- Bruker Nano, Inc.
- Markus B. Raschke
- G01 - MEASURING TESTING
Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,869,602
- Issue date Oct 28, 2014
- Anasys Instruments Corp.
- Mikhail Belkin
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
- Patent number 8,793,811
- Issue date Jul 29, 2014
- Anasys Instruments
- Craig Prater
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods And Systems For Scanning Probe Sample Property Measurement...
- Publication number 20210080484
- Publication date Mar 18, 2021
- The Regents of the University of Colorado, a Body Corporate
- Rafael Piestun
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Physical Property Measurement Using a Probe...
- Publication number 20160033547
- Publication date Feb 4, 2016
- Bruker Nano, Inc.
- Markus B. Raschke
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Physical Property Measurement Using a Probe...
- Publication number 20150067930
- Publication date Mar 5, 2015
- Bruker Nano, Inc.
- Markus B. Raschke
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Physical Property Measurement Using a Probe...
- Publication number 20140259234
- Publication date Sep 11, 2014
- Bruker Nano, Inc.
- Markus B. Raschke
- G01 - MEASURING TESTING