Markus Bartscher

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Edemissen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for monitoring the functional state of a system for computer...
- Patent number 11,047,810
- Issue date Jun 29, 2021
- VOLUME GRAPHICS GMBH
- Torsten Schönfeld
- G01 - MEASURING TESTING
Information Patent Grant
Method for dimensional x-ray measurement, in particular by computed...
- Patent number 10,983,072
- Issue date Apr 20, 2021
- BUNDESREPUBLIK DEUTSCHLAND, VERTRETEN DURCH DAS BUNDESMINISTERIUM FUR WIRTSCH...
- Jens Illemann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determination of localised quality measurements from a volumetric i...
- Patent number 10,572,987
- Issue date Feb 25, 2020
- VOLUME GRAPHICS GMBH
- Markus Bartscher
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DIMENSIONAL X-RAY MEASUREMENT, IN PARTICULAR BY COMPUTED...
- Publication number 20200003704
- Publication date Jan 2, 2020
- BUNDESREPUBLIK DEUTSCHLAND, vertreten durch das BUNDESMINISTERIUM FUR WIRTSCH...
- Jens ILLEMANN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MONITORING THE FUNCTIONAL STATE OF A SYSTEM FOR COMPUTER...
- Publication number 20190265175
- Publication date Aug 29, 2019
- VOLUME GRAPHICS GMBH
- Torsten Schönfeld
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF LOCALISED QUALITY MEASUREMENTS FROM A VOLUMETRIC I...
- Publication number 20170330317
- Publication date Nov 16, 2017
- VOLUME GRAPHICS GMBH
- Markus Bartscher
- G06 - COMPUTING CALCULATING COUNTING