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Markus Bauer
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Oberkochen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for examining a beam of charged particles
Patent number
11,961,705
Issue date
Apr 16, 2024
Carl Zeiss SMT GmbH
Daniel Rhinow
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
Patent number
11,680,963
Issue date
Jun 20, 2023
Carl Zeiss SMT GmbH
Kinga Kornilov
G01 - MEASURING TESTING
Information
Patent Grant
Method for producing a reflective optical element, reflective optic...
Patent number
11,372,334
Issue date
Jun 28, 2022
Carl Zeiss SMT GmbH
Markus Bauer
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Grant
Method and apparatus for determining a wavefront of a massive parti...
Patent number
11,355,311
Issue date
Jun 7, 2022
Carl Zeiss SMT GmbH
Joachim Welte
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
Patent number
11,237,187
Issue date
Feb 1, 2022
Carl Zeiss SMT GmbH
Kinga Kornilov
G01 - MEASURING TESTING
Information
Patent Grant
Beam reverser module and optical power amplifier having such a beam...
Patent number
10,777,958
Issue date
Sep 15, 2020
Carl Zeiss SMT GmbH
Michael Schall
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for producing a reflective optical element, reflective optic...
Patent number
10,534,269
Issue date
Jan 14, 2020
Carl Zeiss SMT GmbH
Markus Bauer
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Grant
Method for producing a reflective optical element, reflective optic...
Patent number
10,481,501
Issue date
Nov 19, 2019
Carl Zeiss SMT GmbH
Markus Bauer
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Polarizer assembly for spatially separation polarization states of...
Patent number
10,394,041
Issue date
Aug 27, 2019
Carl Zeiss SMT GmbH
Markus Bauer
F21 - LIGHTING
Information
Patent Grant
Cooler for use in a device in a vacuum
Patent number
10,303,067
Issue date
May 28, 2019
Carl Zeiss SMT GmbH
Willi Anderl
F28 - HEAT EXCHANGE IN GENERAL
Information
Patent Grant
Mirror, in particular collector mirror for microlithography
Patent number
10,101,569
Issue date
Oct 16, 2018
Carl Zeiss SMT GmbH
Markus Bauer
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Beam reverser module and optical power amplifier having such a beam...
Patent number
9,843,153
Issue date
Dec 12, 2017
Carl Zeiss SMT GmbH
Michael Schall
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR ETCHING A LITHOGRAPHY MASK
Publication number
20230185180
Publication date
Jun 15, 2023
Carl Zeiss SMT GMBH
Fan Tu
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD AND APPARATUS FOR REPAIRING A DEFECT OF A LITHOGRAPHIC MASK
Publication number
20230152685
Publication date
May 18, 2023
Carl Zeiss SMT GMBH
Markus Bauer
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD AND APPARATUS FOR SETTING A SIDE WALL ANGLE OF A PATTERN ELE...
Publication number
20230109566
Publication date
Apr 6, 2023
Carl Zeiss SMT GMBH
Daniel Rhinow
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...
Publication number
20220107340
Publication date
Apr 7, 2022
Carl Zeiss SMT GMBH
Kinga Kornilov
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR EXAMINING A BEAM OF CHARGED PARTICLES
Publication number
20210110996
Publication date
Apr 15, 2021
Carl Zeiss SMT GMBH
Daniel Rhinow
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR DETERMINING A WAVEFRONT OF A MASSIVE PARTI...
Publication number
20200312613
Publication date
Oct 1, 2020
Carl Zeiss SMT GMBH
Joachim Welte
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...
Publication number
20200141972
Publication date
May 7, 2020
Carl Zeiss SMT GMBH
Kinga Kornilov
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PRODUCING A REFLECTIVE OPTICAL ELEMENT, REFLECTIVE OPTIC...
Publication number
20200096874
Publication date
Mar 26, 2020
Carl Zeiss SMT GMBH
Markus Bauer
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
Beam Reverser Module and Optical Power Amplifier Having Such a Beam...
Publication number
20180102620
Publication date
Apr 12, 2018
Carl Zeiss SMT GMBH
Michael Schall
G02 - OPTICS
Information
Patent Application
METHOD FOR PRODUCING A REFLECTIVE OPTICAL ELEMENT, REFLECTIVE OPTIC...
Publication number
20170315453
Publication date
Nov 2, 2017
Carl Zeiss SMT GMBH
Markus Bauer
G02 - OPTICS
Information
Patent Application
MIRROR, IN PARTICULAR COLLECTOR MIRROR FOR MICROLITHOGRAPHY
Publication number
20170254995
Publication date
Sep 7, 2017
Carl Zeiss SMT GMBH
Markus Bauer
G02 - OPTICS
Information
Patent Application
COOLER FOR USE IN A DEVICE IN A VACUUM
Publication number
20160299443
Publication date
Oct 13, 2016
Carl Zeiss SMT GMBH
Willi Anderl
F28 - HEAT EXCHANGE IN GENERAL
Information
Patent Application
Polarizer Assembly For Spatially Separation Polarization States Of...
Publication number
20160018664
Publication date
Jan 21, 2016
Carl Zeiss SMT GMBH
Markus Bauer
G02 - OPTICS
Information
Patent Application
Beam Reverser Module and Optical Power Amplifier Having Such a Beam...
Publication number
20150340829
Publication date
Nov 26, 2015
Carl Zeiss SMT GMBH
Michael Schall
G02 - OPTICS
Information
Patent Application
COOLER FOR PLASMA GENERATION CHAMBER OF EUV RADIATION SOURCE
Publication number
20150083938
Publication date
Mar 26, 2015
CARL ZEISS LASER OPTICS GmbH
Willi Anderl
G02 - OPTICS
Information
Patent Application
EUV COLLECTOR MIRROR SHELL OF AN EUV COLLECTOR FOR EUV LITHOGRAPHY
Publication number
20130176614
Publication date
Jul 11, 2013
CARL ZEISS LASER OPTICS GmbH
Willi Anderl
G02 - OPTICS