Markus Brandner

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Grambach, AT

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Patents Grantslast 30 patents

Information Patent Grant
Imaging a gap between sample and probe of a scanning probe microsco...
- Patent number 10,684,307
- Issue date Jun 16, 2020
- Anton Paar GmbH
- Daniel Koller
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing a height profile of a sample by side view imaging
- Patent number 10,488,434
- Issue date Nov 26, 2019
- Anton Paar GmbH
- Martin Godec-Schönbacher
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Characterizing a Height Profile of a Sample by Side View Imaging
- Publication number 20190049486
- Publication date Feb 14, 2019
- ANTON PAAR GMBH
- Martin GODEC-SCHÖNBACHER
- G01 - MEASURING TESTING
Information Patent Application
Imaging a Gap Between Sample and Probe of a Scanning Probe Microsco...
- Publication number 20180143221
- Publication date May 24, 2018
- ANTON PAAR GMBH
- Daniel Koller
- G01 - MEASURING TESTING