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Patents Grants
last 30 patents
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Patent Grant
Method for open-loop or closed-loop control of the temperature of a...
Patent number
11,821,941
Issue date
Nov 21, 2023
ATT ADVANCED TEMPERATURE TEST SYSTEM GMBH
Markus Eibl
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MODULAR WAFER-CHUCK SYSTEM
Publication number
20240063037
Publication date
Feb 22, 2024
ATT Advanced Temperature Test Systems GmbH
Markus Eibl
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEMPERATURE-CONTROL DEVICE, SYSTEM, AND METHOD FOR CONTROLLING THE...
Publication number
20230207346
Publication date
Jun 29, 2023
ATT Advanced Temperature Test Systems GmbH
Markus Eibl
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR OPEN-LOOP OR CLOSED-LOOP CONTROL OF THE TEMPERATURE OF A...
Publication number
20220334174
Publication date
Oct 20, 2022
ATT Advanced Temperature Test Systems GmbH
Markus Eibl
G01 - MEASURING TESTING