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Markus Estermann
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Babensham, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Light source having a controllable spectrum
Patent number
10,295,407
Issue date
May 21, 2019
Instrument Systems Optische Messtechnik GmbH
Felix Frank
F21 - LIGHTING
Information
Patent Grant
Methods and systems for inspecting bonded wafers
Patent number
9,355,919
Issue date
May 31, 2016
Nanda Technologies GmbH
Markus Estermann
G01 - MEASURING TESTING
Information
Patent Grant
Method and an apparatus for the determination of the 3D coordinates...
Patent number
7,570,370
Issue date
Aug 4, 2009
Steinbichler Optotechnik GmbH
Markus Steinbichler
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
COLORIMETRY METHOD AND SYSTEM
Publication number
20240344975
Publication date
Oct 17, 2024
Instrument Systems GmbH
Elisabeth BOTHSCHAFTER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Light Source Having a Controllable Spectrum
Publication number
20180209847
Publication date
Jul 26, 2018
INSTRUMENT SYSTEMS OPTISCHE MESSTECHNIK GmbH
Felix Frank
G02 - OPTICS
Information
Patent Application
METHODS AND SYSTEMS FOR INSPECTING BONDED WAFERS
Publication number
20130157391
Publication date
Jun 20, 2013
Nanda Technologies GmbH
Markus Estermann
G01 - MEASURING TESTING
Information
Patent Application
Method and an apparatus for the determination of the 3D coordinates...
Publication number
20080130016
Publication date
Jun 5, 2008
Markus Steinbichler
G01 - MEASURING TESTING