Markus Gerardus Martinus Maria VAN KRAAIJ

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Metrology targets
- Patent number 11,982,946
- Issue date May 14, 2024
- ASML Netherlands B.V.
- Nikhil Mehta
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for image analysis
- Patent number 11,720,029
- Issue date Aug 8, 2023
- ASML NETHERLANDS B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,692,948
- Issue date Jul 4, 2023
- ASML Netherlands B.V.
- Nitish Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for angular-resolved spectroscopic lithography...
- Patent number 11,525,786
- Issue date Dec 13, 2022
- ASML Netherlands B.V.
- Arie Jeffrey Den Boef
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatus for simulating interaction of radiation with...
- Patent number 11,429,763
- Issue date Aug 30, 2022
- ASML Netherlands B.V.
- Remco Dirks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for calculating electromagnetic scattering pr...
- Patent number 11,347,151
- Issue date May 31, 2022
- ASML Netherlands B.V.
- Markus Gerardus Martinus Maria Van Kraaij
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for image analysis
- Patent number 11,143,970
- Issue date Oct 12, 2021
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Yield estimation and control
- Patent number 11,119,414
- Issue date Sep 14, 2021
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for image analysis
- Patent number 11,067,901
- Issue date Jul 20, 2021
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for calculating electromagnetic scattering pr...
- Patent number 11,041,816
- Issue date Jun 22, 2021
- ASML Netherlands B.V.
- Maxim Pisarenco
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and methods, substrates having metrology targe...
- Patent number 11,022,900
- Issue date Jun 1, 2021
- ASML Netherlands B.V.
- Simon Gijsbert Josephus Mathijssen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for measuring a parameter of interest using im...
- Patent number 10,983,445
- Issue date Apr 20, 2021
- ASML Netherlands B.V.
- Nitesh Pandey
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for angular-resolved spectroscopic lithography...
- Patent number 10,955,353
- Issue date Mar 23, 2021
- ASML Netherlands B.V.
- Arie Jeffrey Den Boef
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining a value of a parameter of interest, method of...
- Patent number 10,795,269
- Issue date Oct 6, 2020
- ASML Netherlands B.V.
- Zili Zhou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection apparatus and methods, substrates having metrology targe...
- Patent number 10,761,432
- Issue date Sep 1, 2020
- ASML Netherlands B.V.
- Simon Gijsbert Josephus Mathijssen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for image analysis
- Patent number 10,732,513
- Issue date Aug 4, 2020
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology method and apparatus, lithographic system and device manu...
- Patent number 10,725,386
- Issue date Jul 28, 2020
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatuses for measurement of a parameter of a feature...
- Patent number 10,649,345
- Issue date May 12, 2020
- ASML Netherlands B.V.
- Maxim Pisarenco
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Yield estimation and control
- Patent number 10,627,723
- Issue date Apr 21, 2020
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for image analysis
- Patent number 10,607,334
- Issue date Mar 31, 2020
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for simulating interaction of radiation with...
- Patent number 10,592,618
- Issue date Mar 17, 2020
- ASML Netherlands B.V.
- Remco Dirks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for image analysis
- Patent number 10,437,157
- Issue date Oct 8, 2019
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology method and apparatus, lithographic system and device manu...
- Patent number 10,331,041
- Issue date Jun 25, 2019
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for angular-resolved spectroscopic lithography...
- Patent number 10,241,055
- Issue date Mar 26, 2019
- ASML Netherlands B.V.
- Arie Jeffrey Maria Den Boef
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for simulating interaction of radiation with...
- Patent number 10,146,140
- Issue date Dec 4, 2018
- ASML Netherlands B.V.
- Maxim Pisarenco
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method and apparatus, lithographic system and device manu...
- Patent number 10,126,662
- Issue date Nov 13, 2018
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection apparatus and methods, substrates having metrology targe...
- Patent number 9,958,791
- Issue date May 1, 2018
- ASML Netherlands B.V.
- Simon Gijsbert Josephus Mathijssen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method and apparatus, lithographic system and device manu...
- Patent number 9,910,366
- Issue date Mar 6, 2018
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for angular-resolved spectroscopic lithography...
- Patent number 8,760,662
- Issue date Jun 24, 2014
- ASML Netherlands B.V.
- Arie Jeffrey Den Boef
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for determining electromagnetic scattering pr...
- Patent number 8,645,109
- Issue date Feb 4, 2014
- ASML Netherlands B.V.
- Remco Dirks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY TARGET OPTIMIZATION
- Publication number 20240320528
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Patrick Philipp HELFENSTEIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALIGNING A DISTORTED IMAGE
- Publication number 20240233305
- Publication date Jul 11, 2024
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMET...
- Publication number 20240152060
- Publication date May 9, 2024
- ASML NETHERLANDS B.V.
- Patrick Philipp HELFENSTEIN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY TARGET SIMULATION
- Publication number 20240118625
- Publication date Apr 11, 2024
- ASML NETHERLANDS B.V.
- Markus Gerardus Martinus Maria VAN KRAAIJ
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230296533
- Publication date Sep 21, 2023
- ASML NETHERLANDS B.V.
- Nitish KUMAR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS AND METHOD FOR SELECTING INFORMATIVE PATTERNS FOR TRAININ...
- Publication number 20230267711
- Publication date Aug 24, 2023
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMET...
- Publication number 20230004096
- Publication date Jan 5, 2023
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMPROVEMENTS IN METROLOGY TARGETS
- Publication number 20220260929
- Publication date Aug 18, 2022
- ASML NETHERLANDS B.V.
- Nikhil MEHTA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PREDICTING SUBSTRATE IMAGE
- Publication number 20220187713
- Publication date Jun 16, 2022
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR IMAGE ANALYSIS
- Publication number 20220026811
- Publication date Jan 27, 2022
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
YIELD ESTIMATION AND CONTROL
- Publication number 20210405545
- Publication date Dec 30, 2021
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DECREASING UNCERTAINTY IN MACHINE LEARNING MODEL PREDICT...
- Publication number 20210286270
- Publication date Sep 16, 2021
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus for Angular-Resolved Spectroscopic Lithography...
- Publication number 20210208083
- Publication date Jul 8, 2021
- ASML NETHERLANDS B.V.
- Arie Jeffrey DEN BOEF
- G01 - MEASURING TESTING
Information Patent Application
HIDDEN DEFECT DETECTION AND EPE ESTIMATION BASED ON THE EXTRACTED 3...
- Publication number 20210174491
- Publication date Jun 10, 2021
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR IMAGE ANALYSIS
- Publication number 20200356009
- Publication date Nov 12, 2020
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20200348244
- Publication date Nov 5, 2020
- ASML NETHERLANDS B.V.
- Nitish KUMAR
- G01 - MEASURING TESTING
Information Patent Application
Inspection Apparatus and Methods, Substrates Having Metrology Targe...
- Publication number 20200348605
- Publication date Nov 5, 2020
- ASML NETHERLANDS B.V.
- Simon Gijsbert Josephus MATHIJSSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
YIELD ESTIMATION AND CONTROL
- Publication number 20200257208
- Publication date Aug 13, 2020
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Apparatus for Simulating Interaction of Radiation with...
- Publication number 20200202054
- Publication date Jun 25, 2020
- ASML NETHERLANDS B.V.
- Remco DIRKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR IMAGE ANALYSIS
- Publication number 20190391498
- Publication date Dec 26, 2019
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Apparatus for Calculating Electromagnetic Scattering Pr...
- Publication number 20190346775
- Publication date Nov 14, 2019
- ASML NETHERLANDS B.V.
- Markus Gerardus Martinus Maria VAN KRAAIJ
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR IMAGE ANALYSIS
- Publication number 20190310554
- Publication date Oct 10, 2019
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Metrology Method and Apparatus, Lithographic System and Device Manu...
- Publication number 20190278190
- Publication date Sep 12, 2019
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR MEASURING A PARAMETER OF INTEREST USING IM...
- Publication number 20190250094
- Publication date Aug 15, 2019
- ASML NETHERLANDS B.V.
- Nitesh PANDEY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and Apparatus for Angular-Resolved Spectroscopic Lithography...
- Publication number 20190170657
- Publication date Jun 6, 2019
- ASML NETHERLANDS B.V.
- Arie Jeffrey Maria DEN BOEF
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method Of Determining A Value Of A Parameter Of Interest, Method Of...
- Publication number 20190129316
- Publication date May 2, 2019
- ASML NETHERLANDS B.V.
- Zili ZHOU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method and Apparatus, Lithographic System and Device Manu...
- Publication number 20190049860
- Publication date Feb 14, 2019
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method and Apparatus, Lithographic System and Device Manu...
- Publication number 20180196357
- Publication date Jul 12, 2018
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR IMAGE ANALYSIS
- Publication number 20170345138
- Publication date Nov 30, 2017
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Apparatus for Simulating Interaction of Radiation with...
- Publication number 20170102623
- Publication date Apr 13, 2017
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G01 - MEASURING TESTING

Markus Gerardus Martinus Maria VAN KRAAIJ

Person

Patents Grantslast 30 patents

Metrology targets

Method and apparatus for image analysis

Inspection apparatus and inspection method

Method and apparatus for angular-resolved spectroscopic lithography...

Methods and apparatus for simulating interaction of radiation with...

Methods and apparatus for calculating electromagnetic scattering pr...

Method and apparatus for image analysis

Yield estimation and control

Method and apparatus for image analysis

Methods and apparatus for calculating electromagnetic scattering pr...

Inspection apparatus and methods, substrates having metrology targe...

Method and apparatus for measuring a parameter of interest using im...

Method and apparatus for angular-resolved spectroscopic lithography...

Method of determining a value of a parameter of interest, method of...

Inspection apparatus and methods, substrates having metrology targe...

Method and apparatus for image analysis

Metrology method and apparatus, lithographic system and device manu...

Methods and apparatuses for measurement of a parameter of a feature...

Yield estimation and control

Method and apparatus for image analysis

Methods and apparatus for simulating interaction of radiation with...

Method and apparatus for image analysis

Metrology method and apparatus, lithographic system and device manu...

Method and apparatus for angular-resolved spectroscopic lithography...

Methods and apparatus for simulating interaction of radiation with...

Metrology method and apparatus, lithographic system and device manu...

Inspection apparatus and methods, substrates having metrology targe...

Metrology method and apparatus, lithographic system and device manu...

Method and apparatus for angular-resolved spectroscopic lithography...

Methods and apparatus for determining electromagnetic scattering pr...

Patents Applicationslast 30 patents

METROLOGY TARGET OPTIMIZATION

ALIGNING A DISTORTED IMAGE

METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMET...

METROLOGY TARGET SIMULATION

INSPECTION APPARATUS AND INSPECTION METHOD

APPARATUS AND METHOD FOR SELECTING INFORMATIVE PATTERNS FOR TRAININ...

METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMET...

IMPROVEMENTS IN METROLOGY TARGETS

METHOD AND APPARATUS FOR PREDICTING SUBSTRATE IMAGE

METHOD AND APPARATUS FOR IMAGE ANALYSIS

YIELD ESTIMATION AND CONTROL

METHOD FOR DECREASING UNCERTAINTY IN MACHINE LEARNING MODEL PREDICT...

Method and Apparatus for Angular-Resolved Spectroscopic Lithography...

HIDDEN DEFECT DETECTION AND EPE ESTIMATION BASED ON THE EXTRACTED 3...

METHOD AND APPARATUS FOR IMAGE ANALYSIS

INSPECTION APPARATUS AND INSPECTION METHOD

Inspection Apparatus and Methods, Substrates Having Metrology Targe...

YIELD ESTIMATION AND CONTROL

Methods and Apparatus for Simulating Interaction of Radiation with...

METHOD AND APPARATUS FOR IMAGE ANALYSIS

Methods and Apparatus for Calculating Electromagnetic Scattering Pr...

METHOD AND APPARATUS FOR IMAGE ANALYSIS

Metrology Method and Apparatus, Lithographic System and Device Manu...

METHOD AND APPARATUS FOR MEASURING A PARAMETER OF INTEREST USING IM...

Method and Apparatus for Angular-Resolved Spectroscopic Lithography...

Method Of Determining A Value Of A Parameter Of Interest, Method Of...

Metrology Method and Apparatus, Lithographic System and Device Manu...

Metrology Method and Apparatus, Lithographic System and Device Manu...

METHOD AND APPARATUS FOR IMAGE ANALYSIS

Methods and Apparatus for Simulating Interaction of Radiation with...