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Markus Gerardus Martinus Van Kraaij
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Mierlo, NL
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last 30 patents
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Patent Grant
Method and apparatus for angular-resolved spectroscopic lithography...
Patent number
8,054,467
Issue date
Nov 8, 2011
ASML Netherlands B.V.
Arie Jeffrey Maria Den Boef
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for angular-resolved spectroscopic lithography...
Patent number
7,791,732
Issue date
Sep 7, 2010
ASML Netherlands B.V.
Arie Jeffrey Maria Den Boef
G01 - MEASURING TESTING
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Patent Grant
Characterization of transmission losses in an optical system
Patent number
7,791,724
Issue date
Sep 7, 2010
ASML Netherlands B.V.
Arie Jeffrey Den Boef
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
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Patent Application
Method and Apparatus for Angular-Resolved Spectroscopic Lithography...
Publication number
20120038929
Publication date
Feb 16, 2012
ASML NETHERLANDS B.V.
Arie Jeffrey Maria Den Boef
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for angular-resolved spectroscopic lithography...
Publication number
20110007314
Publication date
Jan 13, 2011
ASML NETHERLANDS B.V.
Arie Jeffrey Maria Den Boef
G01 - MEASURING TESTING