Markus Hacksteiner

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for electrochemical quality control of electri...
- Patent number 10,488,366
- Issue date Nov 26, 2019
- MTI GmbH
- Markus Hacksteiner
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for metalizing wafers
- Patent number 9,506,164
- Issue date Nov 29, 2016
- Markus Hacksteiner
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

Patents Applicationslast 30 patents

Information Patent Application
METHOD, HOLDER AND ADAPTER FOR TREATING MICROCHIP SUBSTRATES
- Publication number 20240150923
- Publication date May 9, 2024
- MTI GmbH
- Markus HACKSTEINER
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
APPARATUS AND METHOD FOR ELECTROCHEMICAL QUALITY CONTROL OF ELECTRI...
- Publication number 20170350849
- Publication date Dec 7, 2017
- MTI GmbH
- Markus HACKSTEINER
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR METALIZING WAFERS
- Publication number 20130284602
- Publication date Oct 31, 2013
- Markus Hacksteiner
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR