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Markus I. Flik
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Boston, MA, US
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last 30 patents
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Patent Grant
Non-contact temperature measurement of a film growing on a substrate
Patent number
5,377,126
Issue date
Dec 27, 1994
Massachusetts Institute of Technology
Markus I. Flik
G01 - MEASURING TESTING
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Patent Grant
Superconducting detector and method of making same
Patent number
5,264,375
Issue date
Nov 23, 1993
Massachusetts Institute of Technology
Christopher A. Bang
G01 - MEASURING TESTING