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Markus Kollwitz
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Neubiberg, DE
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last 30 patents
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Patent Application
INTEGRATED CIRCUIT TEST SYSTEM AND METHOD WITH TEST DRIVER SHARING
Publication number
20090085598
Publication date
Apr 2, 2009
QIMONDA AG
Markus Kollwitz
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE TEST SYSTEM AND METHOD
Publication number
20080246505
Publication date
Oct 9, 2008
QIMONDA AG
Markus Kollwitz
G11 - INFORMATION STORAGE
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Patent Application
SYSTEM AND METHOD FOR THE ELECTRICAL CONTACTING OF SEMICONDUCTOR DE...
Publication number
20080246499
Publication date
Oct 9, 2008
QIMONDA AG
Markus Kollwitz
G01 - MEASURING TESTING
Information
Patent Application
TEST DEVICE FOR SEMICONDUCTOR DEVICES
Publication number
20080238462
Publication date
Oct 2, 2008
QIMONDA AG
Udo Hartmann
G01 - MEASURING TESTING