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Markus Lenski
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Dresden, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Front-end-of-line device structure and method of forming such a fro...
Patent number
10,483,154
Issue date
Nov 19, 2019
GLOBALFOUNDRIES Inc.
Elliot John Smith
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming a semiconductor structure including silicided and...
Patent number
9,646,838
Issue date
May 9, 2017
GLOBALFOUNDRIES Inc.
Dominic Thurmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods for fabricating integrated circuits with robust gate electr...
Patent number
9,184,260
Issue date
Nov 10, 2015
GLOBALFOUNDRIES, INC.
Joanna Wasyluk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-step deposition of a spacer material for reducing void format...
Patent number
8,987,103
Issue date
Mar 24, 2015
GLOBALFOUNDRIES Inc.
Markus Lenski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-K metal gate electrode structures formed by cap layer removal...
Patent number
8,987,144
Issue date
Mar 24, 2015
GLOBALFOUNDRIES Inc.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Strain enhancement in transistors comprising an embedded strain-ind...
Patent number
8,969,916
Issue date
Mar 3, 2015
GLOBALFOUNDRIES Inc.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of reducing material loss in isolation structures by introd...
Patent number
8,871,586
Issue date
Oct 28, 2014
GLOBALFOUNDRIES Inc.
Thilo Scheiper
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Three-dimensional semiconductor device comprising an inter-die conn...
Patent number
8,847,404
Issue date
Sep 30, 2014
GLOBALFOUNDRIES Inc.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spacer for a gate electrode having tensile stress and a method of f...
Patent number
8,847,205
Issue date
Sep 30, 2014
GLOBALFOUNDRIES Inc.
Hartmut Ruelke
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Complementary transistors comprising high-k metal gate electrode st...
Patent number
8,835,209
Issue date
Sep 16, 2014
GLOBALFOUNDRIES Inc.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
NiSi rework procedure to remove platinum residuals
Patent number
8,835,298
Issue date
Sep 16, 2014
GLOBALFOUNDRIES Inc.
Sivakumar Kumarasamy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Strain enhancement in transistors comprising an embedded strain-ind...
Patent number
8,828,819
Issue date
Sep 9, 2014
GLOBALFOUNDRIES Inc.
Stephen Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of forming a semiconductor device by performing a wet acid...
Patent number
8,815,674
Issue date
Aug 26, 2014
GLOBALFOUNDRIES Inc.
Berthold Reimer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Oxide deposition by using a double liner approach for reducing patt...
Patent number
8,772,843
Issue date
Jul 8, 2014
GLOBALFOUNDRIES Inc.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sophisticated gate electrode structures formed by cap layer removal...
Patent number
8,765,559
Issue date
Jul 1, 2014
GLOBALFOUNDRIES Inc.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of forming metal silicide regions on semiconductor devices
Patent number
8,765,586
Issue date
Jul 1, 2014
GLOBALFOUNDRIES Inc.
Clemens Fitz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of forming a semiconductor device while preventing or reduc...
Patent number
8,765,542
Issue date
Jul 1, 2014
GLOBALFOUNDRIES Inc.
Joachim Patzer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for making high-K metal gate electrode structures by separat...
Patent number
8,735,270
Issue date
May 27, 2014
GLOBALFOUNDRIES Inc.
Klaus Hempel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Superior stability of characteristics of transistors having an earl...
Patent number
8,652,917
Issue date
Feb 18, 2014
GLOBALFOUNDRIES, INC.
Markus Lenski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Heat dissipation in temperature critical device areas of semiconduc...
Patent number
8,564,120
Issue date
Oct 22, 2013
GLOBALFOUNDRIES Inc.
Anthony Mowry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spacer for a gate electrode having tensile stress and a method of f...
Patent number
8,557,667
Issue date
Oct 15, 2013
Globalfoundries Inc.
Hartmut Rülke
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test structure for monitoring process characteristics for forming e...
Patent number
8,530,894
Issue date
Sep 10, 2013
Advanced Micro Devices, Inc.
Anthony Mowry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dopant profile tuning for MOS devices by adapting a spacer width pr...
Patent number
8,507,351
Issue date
Aug 13, 2013
GLOBALFOUNDRIES Inc.
Anthony Mowry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing a CMOS device including molecular storage e...
Patent number
8,445,378
Issue date
May 21, 2013
GLOBALFOUNDRIES Inc.
Stephan Kronholz
G11 - INFORMATION STORAGE
Information
Patent Grant
Three-dimensional semiconductor device comprising an inter-die conn...
Patent number
8,440,561
Issue date
May 14, 2013
GLOBALFOUNDRIES Inc.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Work function adjustment in high-K metal gate electrode structures...
Patent number
8,440,559
Issue date
May 14, 2013
GLOBALFOUNDRIES Inc.
Markus Lenski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device formed by a replacement gate approach based on...
Patent number
8,383,500
Issue date
Feb 26, 2013
GLOBALFOUNDRIES Inc.
Gerd Marxsen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for forming CMOS transistors having metal-containing gate el...
Patent number
8,367,495
Issue date
Feb 5, 2013
GLOBALFOUNDRIES Inc.
Sven Beyer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Strain enhancement in transistors comprising an embedded strain-ind...
Patent number
8,357,573
Issue date
Jan 22, 2013
GLOBALFOUNDRIES, Inc.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Enhanced confinement of high-K metal gate electrode structures by r...
Patent number
8,349,694
Issue date
Jan 8, 2013
GLOBALFOUNDRIES Inc.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHODS FOR FABRICATING INTEGRATED CIRCUITS WITH ROBUST GATE ELECTR...
Publication number
20150132914
Publication date
May 14, 2015
GLOBALFOUNDRIES, Inc.
Joanna Wasyluk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF FORMING A SEMICONDUCTOR STRUCTURE INCLUDING SILICIDED AND...
Publication number
20150031179
Publication date
Jan 29, 2015
GLOBALFOUNDRIES INC.
Dominic Thurmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROTECTION OF THE GATE STACK ENCAPSULATION
Publication number
20140353733
Publication date
Dec 4, 2014
Gabriela Dilliway
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STRAIN ENHANCEMENT IN TRANSISTORS COMPRISING AN EMBEDDED STRAIN-IND...
Publication number
20140339604
Publication date
Nov 20, 2014
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS OF FORMING A SEMICONDUCTOR DEVICE BY PERFORMING A WET ACID...
Publication number
20140227869
Publication date
Aug 14, 2014
GLOBALFOUNDRIES INC.
Berthold Reimer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS OF REDUCING MATERIAL LOSS IN ISOLATION STRUCTURES BY INTROD...
Publication number
20140113419
Publication date
Apr 24, 2014
GLOBALFOUNDRIES INC.
Thilo Scheiper
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPACER FOR A GATE ELECTRODE HAVING TENSILE STRESS AND A METHOD OF F...
Publication number
20140011302
Publication date
Jan 9, 2014
GLOBALFOUNDRIES INC.
Hartmut Ruelke
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SUPERIOR STABILITY OF CHARACTERISTICS OF TRANSISTORS HAVING AN EARL...
Publication number
20130316511
Publication date
Nov 28, 2013
GLOBALFOUNDRIES INC.
Markus Lenski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH-K METAL GATE ELECTRODE STRUCTURES FORMED BY SEPARATE REMOVAL O...
Publication number
20130273729
Publication date
Oct 17, 2013
Klaus Hempel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NISI REWORK PROCEDURE TO REMOVE PLATINUM RESIDUALS
Publication number
20130234213
Publication date
Sep 12, 2013
GLOBALFOUNDRIES INC.
Sivakumar KUMARASAMY
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
THREE-DIMENSIONAL SEMICONDUCTOR DEVICE COMPRISING AN INTER-DIE CONN...
Publication number
20130221540
Publication date
Aug 29, 2013
GLOBALFOUNDRIES INC.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods of Forming Metal Silicide Regions on Semiconductor Devices
Publication number
20130157450
Publication date
Jun 20, 2013
GLOBALFOUNDRIES INC.
Clemens Fitz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STRAIN ENHANCEMENT IN TRANSISTORS COMPRISING AN EMBEDDED STRAIN-IND...
Publication number
20130130449
Publication date
May 23, 2013
GLOBALFOUNDRIES INC.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WORK FUNCTION ADJUSTMENT IN HIGH-K METAL GATE ELECTRODE STRUCTURES...
Publication number
20130017679
Publication date
Jan 17, 2013
GLOBALFOUNDRIES INC.
Markus Lenski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEST STRUCTURE FOR MONITORING PROCESS CHARACTERISTICS FOR FORMING E...
Publication number
20120223309
Publication date
Sep 6, 2012
Advanced Micro Devices, Inc.
ANTHONY MOWRY
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Complementary Transistors Comprising High-K Metal Gate Electrode St...
Publication number
20120211838
Publication date
Aug 23, 2012
GLOBALFOUNDRIES INC.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Sophisticated Gate Electrode Structures Formed by Cap Layer Removal...
Publication number
20120196417
Publication date
Aug 2, 2012
GLOBALFOUNDRIES INC.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High-K Metal Gate Electrode Structures Formed by Cap Layer Removal...
Publication number
20120161243
Publication date
Jun 28, 2012
GLOBALFOUNDRIES INC.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Oxide Deposition by Using a Double Liner Approach for Reducing Patt...
Publication number
20120049296
Publication date
Mar 1, 2012
GLOBALFOUNDRIES INC.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Increasing Robustness of a Dual Stress Liner Approach in a Semicond...
Publication number
20120028470
Publication date
Feb 2, 2012
GLOBALFOUNDRIES INC.
Ralf Richter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Reduced STI Topography in High-K Metal Gate Transistors by Using a...
Publication number
20110269277
Publication date
Nov 3, 2011
GLOBALFOUNDRIES INC.
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Maintaining Integrity of a High-K Gate Stack After Embedding a Stre...
Publication number
20110266625
Publication date
Nov 3, 2011
GLOBALFOUNDRIES INC.
Richard Carter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DOPANT PROFILE TUNING FOR MOS DEVICES BY ADAPTING A SPACER WIDTH PR...
Publication number
20110230039
Publication date
Sep 22, 2011
Anthony Mowry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE FORMED BY A REPLACEMENT GATE APPROACH BASED ON...
Publication number
20110186931
Publication date
Aug 4, 2011
Gerd Marxsen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ENHANCED CONFINEMENT OF HIGH-K METAL GATE ELECTRODE STRUCTURES BY R...
Publication number
20110159654
Publication date
Jun 30, 2011
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CAP REMOVAL IN A HIGH-K METAL GATE ELECTRODE STRUCTURE BY USING A S...
Publication number
20110129980
Publication date
Jun 2, 2011
Jens Heinrich
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TRANSISTOR INCLUDING A HIGH-K METAL GATE ELECTRODE STRUCTURE FORMED...
Publication number
20110104863
Publication date
May 5, 2011
Sven Beyer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
THREE-DIMENSIONAL SEMICONDUCTOR DEVICE COMPRISING AN INTER-DIE CONN...
Publication number
20110024914
Publication date
Feb 3, 2011
Stephan Kronholz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
USING HIGH-K DIELECTRICS AS HIGHLY SELECTIVE ETCH STOP MATERIALS IN...
Publication number
20110024805
Publication date
Feb 3, 2011
Thorsten Kammler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CMOS DEVICE INCLUDING MOLECULAR STORAGE ELEMENTS IN A VIA LEVEL
Publication number
20110024912
Publication date
Feb 3, 2011
Stephan Kronholz
G11 - INFORMATION STORAGE