Markus Rottacker

Person

Stuttgart, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Switch circuit, method for operating a switch circuit and an automa...
- Patent number 10,830,820
- Issue date Nov 10, 2020
- Advantest Corporation
- Detlef Müller
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for wireless testing of a plurality of transmi...
- Patent number 9,847,843
- Issue date Dec 19, 2017
- Advantest Corporation
- Jochen Rivoir
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of sharing a test resource at a plurality of test sites, aut...
- Patent number 8,797,046
- Issue date Aug 5, 2014
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
System and method for electronic testing of devices
- Patent number 8,264,236
- Issue date Sep 11, 2012
- Advantest (Singapore) Pte Ltd
- Jose Moreira
- G01 - MEASURING TESTING
Information Patent Grant
Parameterized signal conditioning
- Patent number 7,434,118
- Issue date Oct 7, 2008
- Verigy (Singapore) Pte. Ltd.
- Marc Moessinger
- G01 - MEASURING TESTING
Information Patent Grant
Source synchronous sampling
- Patent number 7,355,378
- Issue date Apr 8, 2008
- Verigy (Singapore) Pte. Ltd.
- Markus Rottacker
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Pin coupler for an integrated circuit tester
- Patent number 7,240,259
- Issue date Jul 3, 2007
- Verigy (Singapore) Pte. Ltd.
- Markus Rottacker
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SWITCH CIRCUIT, METHOD FOR OPERATING A SWITCH CIRCUIT AND AN AUTOMA...
- Publication number 20180045782
- Publication date Feb 15, 2018
- Advantest Corporation
- DETLEF MÜLLER
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR WIRELESS TESTING OF A PLURALITY OF TRANSMI...
- Publication number 20120232826
- Publication date Sep 13, 2012
- Jochen Rivoir
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD OF SHARING A TEST RESOURCE AT A PLURALITY OF TEST SITES, AUT...
- Publication number 20110041012
- Publication date Feb 17, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
System and method for electronic testing of devices
- Publication number 20090138760
- Publication date May 28, 2009
- Jose MOREIRA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Parameterized Signal Conditioning
- Publication number 20080208510
- Publication date Aug 28, 2008
- Marc Moessinger
- G01 - MEASURING TESTING
Information Patent Application
Pin coupler for an integrated circuit tester
- Publication number 20050246603
- Publication date Nov 3, 2005
- Markus Rottacker
- G01 - MEASURING TESTING
Information Patent Application
Parameterized signal conditioning
- Publication number 20040255213
- Publication date Dec 16, 2004
- Marc Moessinger
- G01 - MEASURING TESTING
Information Patent Application
Data flow synchronization
- Publication number 20020141525
- Publication date Oct 3, 2002
- AGILENT TECHNOLOGIES, INC.
- Klaus-Peter Behrens
- G01 - MEASURING TESTING

Markus Rottacker

Person

Patents Grantslast 30 patents

Switch circuit, method for operating a switch circuit and an automa...

Apparatus and method for wireless testing of a plurality of transmi...

Method of sharing a test resource at a plurality of test sites, aut...

System and method for electronic testing of devices

Parameterized signal conditioning

Source synchronous sampling

Pin coupler for an integrated circuit tester

Patents Applicationslast 30 patents

SWITCH CIRCUIT, METHOD FOR OPERATING A SWITCH CIRCUIT AND AN AUTOMA...

APPARATUS AND METHOD FOR WIRELESS TESTING OF A PLURALITY OF TRANSMI...

METHOD OF SHARING A TEST RESOURCE AT A PLURALITY OF TEST SITES, AUT...

System and method for electronic testing of devices

Parameterized Signal Conditioning

Pin coupler for an integrated circuit tester

Parameterized signal conditioning

Data flow synchronization