Markus Weiger

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Zurich, CH

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Patents Grantslast 30 patents

Information Patent Grant
Magnetic resonance imaging method with a decay time function of sub...
- Patent number 7,035,682
- Issue date Apr 25, 2006
- Koninklijke Philips Electronics N.V.
- Johan Van Den Brink
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic resonance imaging method with a decay time function of sub...
- Patent number 6,593,740
- Issue date Jul 15, 2003
- Koninklijke Philips Electronics N.V.
- Johan Van Den Brink
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic resonance imaging method with sub-sampling
- Patent number 6,545,472
- Issue date Apr 8, 2003
- Koninklijke Philips Electronics N.V.
- Klaas Paul Prüssmann
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic resonance imaging method with sub-sampling
- Patent number 6,377,045
- Issue date Apr 23, 2002
- U.S. Philips Corporation
- Johan Samuel Van Den Brink
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic resonance imaging method and apparatus
- Patent number 6,326,786
- Issue date Dec 4, 2001
- U.S. Philips Corporation
- Klaas P. Pruessmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Reduction of susceptibility artifacts in subencoded single-shot mag...
- Publication number 20050212517
- Publication date Sep 29, 2005
- Thomas Jaermann
- G01 - MEASURING TESTING
Information Patent Application
Magnetic resonance imaging method with a decay time function of sub...
- Publication number 20030122545
- Publication date Jul 3, 2003
- KONINKLIJKE PHILIPS ELECTRONICS, N.V.
- Johan Van Den Brink
- G01 - MEASURING TESTING