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Marlon W. Hug
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Kuna, ID, US
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last 30 patents
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Patent Grant
Non-contact measurement of memory cell threshold voltage
Patent number
10,672,500
Issue date
Jun 2, 2020
Micron Technology, Inc.
Amitava Majumdar
G11 - INFORMATION STORAGE
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Patent Grant
Non-contact electron beam probing techniques and related structures
Patent number
10,650,891
Issue date
May 12, 2020
Micron Technology, Inc.
Amitava Majumdar
G11 - INFORMATION STORAGE
Information
Patent Grant
Non-contact electron beam probing techniques and related structures
Patent number
10,403,359
Issue date
Sep 3, 2019
Micron Technology, Inc.
Amitava Majumdar
G11 - INFORMATION STORAGE
Information
Patent Grant
Non-contact measurement of memory cell threshold voltage
Patent number
10,381,101
Issue date
Aug 13, 2019
Micron Technology, Inc.
Amitava Majumdar
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
TEST STRUCTURES FOR A WAFER, AND ASSOCIATED DEVICES, SYSTEMS, AND M...
Publication number
20230298951
Publication date
Sep 21, 2023
Micron Technology, Inc.
Chase M. Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
Publication number
20190355418
Publication date
Nov 21, 2019
Micron Technology, Inc.
Amitava Majumdar
G11 - INFORMATION STORAGE
Information
Patent Application
NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE
Publication number
20190341122
Publication date
Nov 7, 2019
Micron Technology, Inc.
Amitava Majumdar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE
Publication number
20190189237
Publication date
Jun 20, 2019
Micron Technology, Inc.
Amitava Majumdar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
Publication number
20190189209
Publication date
Jun 20, 2019
Micron Technology, Inc.
Amitava Majumdar
G11 - INFORMATION STORAGE