Maroun Kassab

Person

St-Eustache, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Data mining shape based data
- Patent number 9,244,946
- Issue date Jan 26, 2016
- International Business Machines Corporation
- Maroun Kassab
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data mining shape based data
- Patent number 9,235,601
- Issue date Jan 12, 2016
- International Business Machines Corporation
- Maroun Kassab
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identifying defects
- Patent number 8,571,299
- Issue date Oct 29, 2013
- International Business Machines Corporation
- Mohammed F. Fayaz
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing integrated circuits
- Patent number 8,136,082
- Issue date Mar 13, 2012
- International Business Machines Corporation
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing integrated circuits
- Patent number 7,971,176
- Issue date Jun 28, 2011
- International Business Machines Corporation
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining features associated with fails of integrated...
- Patent number 7,870,519
- Issue date Jan 11, 2011
- International Business Machines Corporation
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Grant
System and method for signature-based systematic condition detectio...
- Patent number 7,853,848
- Issue date Dec 14, 2010
- International Business Machines Corporation
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing a scan chain to isolate defects
- Patent number 7,752,514
- Issue date Jul 6, 2010
- International Business Machines Corporation
- Leendert M. Huisman
- G01 - MEASURING TESTING
Information Patent Grant
Iterative process for identifying systematics in data
- Patent number 7,596,736
- Issue date Sep 29, 2009
- International Business Machines Corporation
- Maroun Kassab
- G01 - MEASURING TESTING
Information Patent Grant
Learning based logic diagnosis
- Patent number 7,558,999
- Issue date Jul 7, 2009
- International Business Machines Corporation
- James W. Adkisson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for testing a scan chain to isolate defects
- Patent number 7,313,744
- Issue date Dec 25, 2007
- International Business Machines Corporation
- Leendert M. Huisman
- G01 - MEASURING TESTING
Information Patent Grant
Method to detect systematic defects in VLSI manufacturing
- Patent number 6,880,136
- Issue date Apr 12, 2005
- International Business Machines Corporation
- Leendert M. Huisman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DATA MINING SHAPE BASED DATA
- Publication number 20140149458
- Publication date May 29, 2014
- International Business Machines Corporation
- Maroun M. Kassab
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA MINING SHAPE BASED DATA
- Publication number 20140149408
- Publication date May 29, 2014
- International Business Machines Corporation
- Maroun M. Kassab
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFYING DEFECTS
- Publication number 20120050728
- Publication date Mar 1, 2012
- International Business Machines Corporation
- Mohammed F. Fayaz
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING INTEGRATED CIRCUITS
- Publication number 20110214102
- Publication date Sep 1, 2011
- International Business Machines Corporation
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING INTEGRATED CIRCUITS
- Publication number 20090240458
- Publication date Sep 24, 2009
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING AN INTEGRATED CIRCUIT AND ANALYZING TEST DATA
- Publication number 20090132976
- Publication date May 21, 2009
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SIGNATURE-BASED SYSTEMATIC CONDITION DETECTIO...
- Publication number 20090106614
- Publication date Apr 23, 2009
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR TESTING A SCAN CHAIN TO ISOLATE DEFECTS
- Publication number 20080059857
- Publication date Mar 6, 2008
- IBM
- LEENDERT M. HUISMAN
- G01 - MEASURING TESTING
Information Patent Application
ITERATIVE PROCESS FOR IDENTIFYING SYSTEMATICS IN DATA
- Publication number 20070226566
- Publication date Sep 27, 2007
- Maroun Kassab
- G01 - MEASURING TESTING
Information Patent Application
LEARNING BASED LOGIC DIAGNOSIS
- Publication number 20050273656
- Publication date Dec 8, 2005
- International Business Machines Corporation
- James W. Adkisson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR DEFECT ISOLATION
- Publication number 20050193297
- Publication date Sep 1, 2005
- International Business Machines Corporation
- Leendert M. Huisman
- G01 - MEASURING TESTING
Information Patent Application
Method to detect systematic defects in VLSI manufacturing
- Publication number 20040009616
- Publication date Jan 15, 2004
- International Business Machines Corporation
- Leendert M. Huisman
- H01 - BASIC ELECTRIC ELEMENTS

Maroun Kassab

Person

Patents Grantslast 30 patents

Data mining shape based data

Data mining shape based data

Identifying defects

Method for testing integrated circuits

Method for testing integrated circuits

Method for determining features associated with fails of integrated...

System and method for signature-based systematic condition detectio...

Methods and apparatus for testing a scan chain to isolate defects

Iterative process for identifying systematics in data

Learning based logic diagnosis

Methods and apparatus for testing a scan chain to isolate defects

Method to detect systematic defects in VLSI manufacturing

Patents Applicationslast 30 patents

DATA MINING SHAPE BASED DATA

DATA MINING SHAPE BASED DATA

IDENTIFYING DEFECTS

METHOD FOR TESTING INTEGRATED CIRCUITS

METHOD FOR TESTING INTEGRATED CIRCUITS

METHOD FOR TESTING AN INTEGRATED CIRCUIT AND ANALYZING TEST DATA

SYSTEM AND METHOD FOR SIGNATURE-BASED SYSTEMATIC CONDITION DETECTIO...

METHODS AND APPARATUS FOR TESTING A SCAN CHAIN TO ISOLATE DEFECTS

ITERATIVE PROCESS FOR IDENTIFYING SYSTEMATICS IN DATA

LEARNING BASED LOGIC DIAGNOSIS

METHODS AND APPARATUS FOR DEFECT ISOLATION

Method to detect systematic defects in VLSI manufacturing