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Marshal A. Miller
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White Plains, NY, US
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last 30 patents
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Patent Grant
Process-metrology reproducibility bands for lithographic photomasks
Patent number
10,210,292
Issue date
Feb 19, 2019
International Business Machines Corporation
Todd C. Bailey
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Process-metrology reproducibility bands for lithographic photomasks
Patent number
9,928,316
Issue date
Mar 27, 2018
International Business Machines Corporation
Todd C. Bailey
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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last 30 patents
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Patent Application
PROCESS-METROLOGY REPRODUCIBILITY BANDS FOR LITHOGRAPHIC PHOTOMASKS
Publication number
20180101630
Publication date
Apr 12, 2018
International Business Machines Corporation
Todd C. Bailey
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
PROCESS-METROLOGY REPRODUCIBILITY BANDS FOR LITHOGRAPHIC PHOTOMASKS
Publication number
20160283617
Publication date
Sep 29, 2016
International Business Machines Corporation
Todd C. Bailey
G06 - COMPUTING CALCULATING COUNTING