Martin A. Gifford

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Palo Alto, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Measurement of critical dimensions of nanostructures using X-ray gr...
- Patent number 10,060,865
- Issue date Aug 28, 2018
- Lyncean Technologies, Inc.
- Ronald D. Ruth
- G01 - MEASURING TESTING
Information Patent Grant
Laser diode light imaging optics
- Patent number 5,076,678
- Issue date Dec 31, 1991
- Lightwave Electronics Corporation
- William M. Grossman
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT OF CRITICAL DIMENSIONS OF NANOSTRUCTURES USING X-RAY GR...
- Publication number 20160266056
- Publication date Sep 15, 2016
- Lyncean Technologies, Inc.
- Ronald D. Ruth
- G01 - MEASURING TESTING