Martin A. Klos

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Boca Raton, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for improving measurement accuracy using active lateral scan...
- Patent number 5,773,824
- Issue date Jun 30, 1998
- International Business Machines Corporation
- Edwin Flecha
- G01 - MEASURING TESTING
Information Patent Grant
Dual quad flexure scanner
- Patent number 5,360,974
- Issue date Nov 1, 1994
- International Business Machines Corp.
- James M. Hammond
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Automatic tip approach method and apparatus for scanning probe micr...
- Patent number 5,262,643
- Issue date Nov 16, 1993
- International Business Machines Corp.
- James M. Hammond
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample carriage for scanning probe microscope
- Patent number 5,260,577
- Issue date Nov 9, 1993
- International Business Machines Corp.
- David W. Abraham
- G01 - MEASURING TESTING