Membership
Tour
Register
Log in
Martin A. Sanzari
Follow
Person
Fairlawn, NJ, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for optical measurements using multiple beam in...
Patent number
9,952,067
Issue date
Apr 24, 2018
Kulite Semiconductor Products, Inc.
Martin A. Sanzari
G01 - MEASURING TESTING
Information
Patent Grant
Two wavelength optical interferometric pressure switch and pressure...
Patent number
9,945,740
Issue date
Apr 17, 2018
Kulite Semiconductor Products, Inc.
Martin A. Sanzari
G01 - MEASURING TESTING
Information
Patent Grant
Silicon based pressure and acceleration optical interferometric sen...
Patent number
9,829,307
Issue date
Nov 28, 2017
Kulite Semiconductor Products, Inc.
Martin A. Sanzari
G01 - MEASURING TESTING
Information
Patent Grant
Thermally stable high temperature pressure and acceleration optical...
Patent number
9,810,594
Issue date
Nov 7, 2017
Kulite Semiconductor Products, Inc.
Martin A. Sanzari
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TWO WAVELENGTH OPTICAL INTERFEROMETRIC PRESSURE SWITCH AND PRESSURE...
Publication number
20160334275
Publication date
Nov 17, 2016
Kulite Semiconductor Products, Inc.
Martin A. Sanzari
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR OPTICAL MEASUREMENTS USING MULTIPLE BEAM IN...
Publication number
20160327414
Publication date
Nov 10, 2016
Kulite Semiconductor Products, Inc.
Martin A. Sanzari
G01 - MEASURING TESTING
Information
Patent Application
SILLICON BASED PRESSURE AND ACCELERATION OPTICAL INTERFEROMETRIC SE...
Publication number
20160273904
Publication date
Sep 22, 2016
Kulite Semiconductor Products, Inc.
Martin A. Sanzari
G01 - MEASURING TESTING
Information
Patent Application
THERMALLY STABLE HIGH TEMPERATURE PRESSURE AND ACCELERATION OPTICAL...
Publication number
20160202135
Publication date
Jul 14, 2016
Kulite Semiconductor Products, Inc.
Martin A. Sanzari
G01 - MEASURING TESTING