Martin Andrew Smith

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for detecting scratches on non-semiconductor wa...
- Patent number 7,649,624
- Issue date Jan 19, 2010
- Crystal Technology, Inc.
- Yun-Biao Xin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR DETECTING SCRATCHES ON NON-SEMICONDUCTOR WA...
- Publication number 20100014074
- Publication date Jan 21, 2010
- Yun-Biao Xin
- G01 - MEASURING TESTING