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Martin Arnold
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Konstanz, DE
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last 30 patents
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Patent Grant
Device and method for measuring characteristics of An Ion beam
Patent number
8,426,824
Issue date
Apr 23, 2013
Ion Beam Applications S.A.
Yves Jongen
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Device And Method For Measuring Characteristics Of An Ion Beam
Publication number
20110089329
Publication date
Apr 21, 2011
Yves Jongen
G01 - MEASURING TESTING