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Martin B. Mollat
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McKinney, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor wafer having test modules including pin matrix select...
Patent number
8,436,635
Issue date
May 7, 2013
Texas Instruments Incorporated
Martin B. Mollat
G01 - MEASURING TESTING
Information
Patent Grant
High-voltage variable breakdown voltage (BV) diode for electrostati...
Patent number
8,174,077
Issue date
May 8, 2012
Texas Instruments Incorporated
Martin B. Mollat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-voltage variable breakdown voltage (BV) diode for electrostati...
Patent number
7,986,010
Issue date
Jul 26, 2011
Texas Instruments Incorporated
Martin B. Mollat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to manufacture a thin film resistor
Patent number
7,838,429
Issue date
Nov 23, 2010
Texas Instruments Incorporated
Tony Phan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for locating a sub-surface feature using a scatterometer
Patent number
7,776,625
Issue date
Aug 17, 2010
Texas Instruments Incorporated
Martin B. Mollat
G01 - MEASURING TESTING
Information
Patent Grant
High-voltage variable breakdown voltage (BV) diode for electrostati...
Patent number
7,709,329
Issue date
May 4, 2010
Texas Instruments Incorporated
Martin B. Mollat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for reducing dislocation threading using a suppression implant
Patent number
7,638,415
Issue date
Dec 29, 2009
Texas Instruments Incorporated
Martin Mollat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for reducing dislocation threading using a suppression implant
Patent number
7,466,009
Issue date
Dec 16, 2008
Texas Instruments Incorporated
Martin Mollat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods for analyzing critical defects in analog integrated circuits
Patent number
7,415,378
Issue date
Aug 19, 2008
Texas Instruments Incorporated
Martin B. Mollat
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit having a transistor level top side wafer contact...
Patent number
7,262,109
Issue date
Aug 28, 2007
Texas Instruments Incorporated
John Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing a metal-insulator-metal capacitor using an...
Patent number
7,118,958
Issue date
Oct 10, 2006
Texas Instruments Incorporated
Tony T. Phan
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
LOCOS FILLET FOR DRAIN REDUCED BREAKDOWN IN HIGH VOLTAGE TRANSISTORS
Publication number
20240178318
Publication date
May 30, 2024
TEXAS INSTRUMENTS INCORPORATED
Martin B. Mollat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH-VOLTAGE VARIABLE BREAKDOWN VOLTAGE (BV) DIODE FOR ELECTROSTATI...
Publication number
20110278693
Publication date
Nov 17, 2011
TEXAS INSTRUMENTS INCORPORATED
Martin B. Mollat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR WAFER HAVING TEST MODULES INCLUDING PIN MATRIX SELECT...
Publication number
20110050275
Publication date
Mar 3, 2011
TEXAS INSTRUMENTS INCORPORATED
MARTIN B. MOLLAT
G01 - MEASURING TESTING
Information
Patent Application
HIGH-VOLTAGE VARIABLE BREAKDOWN VOLTAGE (BV) DIODE FOR ELECTROSTATI...
Publication number
20100193868
Publication date
Aug 5, 2010
TEXAS INSTRUMENTS INCORPORATED
Martin B. Mollat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR REDUCING DISLOCATION THREADING USING A SUPPRESSION IMPLANT
Publication number
20090061606
Publication date
Mar 5, 2009
TEXAS INSTRUMENTS INCORPORATED
Martin Mollat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD TO MANUFACTURE A THIN FILM RESISTOR
Publication number
20090023263
Publication date
Jan 22, 2009
TEXAS INSTRUMENTS INCORPORATED
Tony Phan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High-voltage variable breakdown voltage (BV) diode for electrostati...
Publication number
20080197451
Publication date
Aug 21, 2008
Texas Instruments Inc.
Martin B. Mollat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
A METHOD FOR LOCATING A SUB-SURFACE FEATURE USING A SCATTEROMETER
Publication number
20070287204
Publication date
Dec 13, 2007
TEXAS INSTRUMENTS INCORPORATED
Martin B. Mollat
G01 - MEASURING TESTING
Information
Patent Application
A METHOD FOR REDUCING DISLOCATION THREADING USING A SUPPRESSION IMP...
Publication number
20070281433
Publication date
Dec 6, 2007
TEXAS INSTRUMENTS INCORPORATED
Martin Mollat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Integrated circuit having a transistor level top side wafer contact...
Publication number
20070045732
Publication date
Mar 1, 2007
Texas Instruments Inc.
John Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of manufacturing a metal-insulator-metal capacitor using an...
Publication number
20060197134
Publication date
Sep 7, 2006
Texas Instruments, Inc.
Tony T. Phan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for analyzing critical defects in analog integrated circuits
Publication number
20060171221
Publication date
Aug 3, 2006
Texas Instruments, Inc.
Martin B. Mollat
G01 - MEASURING TESTING