Membership
Tour
Register
Log in
Martin BECK
Follow
Person
Jena, DE
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method for localizing signal sources in localization microscopy
Patent number
11,428,634
Issue date
Aug 30, 2022
Carl Zeiss Microscopy GmbH
Thomas Kalkbrenner
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for generating an overview image using a large aperture obje...
Patent number
11,327,288
Issue date
May 10, 2022
Carl Zeiss Microscopy GmbH
Jakob Haarstrich
G02 - OPTICS
Information
Patent Grant
Multi-line detection method
Patent number
10,567,681
Issue date
Feb 18, 2020
Carl Zeiss Microscopy GmbH
Martin Beck
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
Method for generating an overview image using a large aperture obje...
Publication number
20210239961
Publication date
Aug 5, 2021
CARL ZEISS MICROSCOPY GMBH
Jakob Haarstrich
G02 - OPTICS
Information
Patent Application
METHOD FOR LOCALIZING SIGNAL SOURCES IN LOCALIZATION MICROSCOPY
Publication number
20200300765
Publication date
Sep 24, 2020
Thomas Kalkbrenner
G01 - MEASURING TESTING
Information
Patent Application
MULTI-LINE DETECTION METHOD
Publication number
20180191970
Publication date
Jul 5, 2018
CARL ZEISS MICROSCOPY GMBH
Martin BECK
G02 - OPTICS