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Martin Cafourek
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Brno, CZ
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Patents Grants
last 30 patents
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Patent Grant
Cryogenic specimen processing in a charged particle microscope
Patent number
10,170,275
Issue date
Jan 1, 2019
FEI Company
John Mitchels
G01 - MEASURING TESTING
Information
Patent Grant
Specimen holder for a charged particle microscope
Patent number
9,741,527
Issue date
Aug 22, 2017
FEI Company
Tomas Vystavel
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Environmental cell for charged particle beam system
Patent number
9,679,741
Issue date
Jun 13, 2017
FEI Company
Libor Novak
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
CRYOGENIC SPECIMEN PROCESSING IN A CHARGED PARTICLE MICROSCOPE
Publication number
20180114671
Publication date
Apr 26, 2018
FEI Company
John Mitchels
G01 - MEASURING TESTING
Information
Patent Application
INVESTIGATION OF HIGH-TEMPERATURE SPECIMENS IN A CHARGED PARTICLE M...
Publication number
20170103868
Publication date
Apr 13, 2017
FEI Company
Libor Novak
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPECIMEN HOLDER FOR A CHARGED PARTICLE MICROSCOPE
Publication number
20160181059
Publication date
Jun 23, 2016
FEI Company
Tomas Vystavel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Environmental Cell for Charged Particle Beam System
Publication number
20120112062
Publication date
May 10, 2012
FEI Company
Libor Novak
H01 - BASIC ELECTRIC ELEMENTS