Martin CORNILS

Person

Freiburg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
SOI semiconductor structure and method for manufacturing an SOI sem...
- Patent number 11,538,855
- Issue date Dec 27, 2022
- TDK-MICRONAS GMBH
- Christian Sander
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolated hall sensor structure
- Patent number 11,486,944
- Issue date Nov 1, 2022
- TDK-MICRONAS GMBH
- Maria-Cristina Vecchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hall sensor structure
- Patent number 11,437,569
- Issue date Sep 6, 2022
- TDK-MICRONAS GMBH
- Maria-Cristina Vecchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical hall sensor structure
- Patent number 11,360,163
- Issue date Jun 14, 2022
- TDK-MICRONAS GMBH
- Maria-Cristina Vecchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor sensor structure
- Patent number 11,156,677
- Issue date Oct 26, 2021
- TDK-MICRONAS GMBH
- Martin Cornils
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensor structure
- Patent number 11,125,838
- Issue date Sep 21, 2021
- TDK-MICRONAS GMBH
- Martin Cornils
- G01 - MEASURING TESTING
Information Patent Grant
SOI semiconductor structure and method for manufacturing an SOI sem...
- Patent number 11,114,501
- Issue date Sep 7, 2021
- TDK-MICRONAS GMBH
- Christian Sander
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Component semiconductor structure
- Patent number 11,005,033
- Issue date May 11, 2021
- TDK-MICRONAS GMBH
- Martin Cornils
- G01 - MEASURING TESTING
Information Patent Grant
Hall sensor
- Patent number 9,851,419
- Issue date Dec 26, 2017
- TDK-MICRONAS GMBH
- Maria-Cristina Vecchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hall effect sensor device
- Patent number 9,581,658
- Issue date Feb 28, 2017
- Micronas GmbH
- Martin Cornils
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SOI SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING AN SOI SEM...
- Publication number 20210366984
- Publication date Nov 25, 2021
- TDK - Micronas GmbH
- Christian SANDER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERTICAL HALL SENSOR STRUCTURE
- Publication number 20210003641
- Publication date Jan 7, 2021
- TDK - Micronas GmbH
- Maria-Cristina VECCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ISOLATED HALL SENSOR STRUCTURE
- Publication number 20200393523
- Publication date Dec 17, 2020
- TDK - Micronas GmbH
- Maria-Cristina VECCHI
- G01 - MEASURING TESTING
Information Patent Application
HALL SENSOR STRUCTURE
- Publication number 20200365796
- Publication date Nov 19, 2020
- TDK - Micronas GmbH
- Maria-Cristina VECCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR SENSOR STRUCTURE
- Publication number 20200256931
- Publication date Aug 13, 2020
- TDK - Micronas GmbH
- Martin CORNILS
- G01 - MEASURING TESTING
Information Patent Application
COMPONENT SEMICONDUCTOR STRUCTURE
- Publication number 20200227627
- Publication date Jul 16, 2020
- TDK - Micronas GmbH
- Martin CORNILS
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for checking and calibrating a component
- Publication number 20200200836
- Publication date Jun 25, 2020
- TDK - Micronas GmbH
- Oliver Kawaletz
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR SENSOR STRUCTURE
- Publication number 20200166588
- Publication date May 28, 2020
- TDK - Micronas GmbH
- Martin CORNILS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING AN SOI SEM...
- Publication number 20200161537
- Publication date May 21, 2020
- TDK - Micronas GmbH
- Christian SANDER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HALL SENSOR
- Publication number 20150331068
- Publication date Nov 19, 2015
- Micronas GmbH
- Maria-Cristina VECCHI
- G01 - MEASURING TESTING
Information Patent Application
HALL EFFECT SENSOR DEVICE
- Publication number 20150115950
- Publication date Apr 30, 2015
- Micronas GmbH
- Martin CORNILS
- G01 - MEASURING TESTING

Martin CORNILS

Person

Patents Grantslast 30 patents

SOI semiconductor structure and method for manufacturing an SOI sem...

Isolated hall sensor structure

Hall sensor structure

Vertical hall sensor structure

Semiconductor sensor structure

Semiconductor sensor structure

SOI semiconductor structure and method for manufacturing an SOI sem...

Component semiconductor structure

Hall sensor

Hall effect sensor device

Patents Applicationslast 30 patents

SOI SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING AN SOI SEM...

VERTICAL HALL SENSOR STRUCTURE

ISOLATED HALL SENSOR STRUCTURE

HALL SENSOR STRUCTURE

SEMICONDUCTOR SENSOR STRUCTURE

COMPONENT SEMICONDUCTOR STRUCTURE

Apparatus and method for checking and calibrating a component

SEMICONDUCTOR SENSOR STRUCTURE

SOI SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING AN SOI SEM...

HALL SENSOR

HALL EFFECT SENSOR DEVICE