Martin D. Leibowitz

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
PICA system detector calibration
- Patent number 7,113,630
- Issue date Sep 26, 2006
- Credence Systems Corporation
- Girish Dajee
- G01 - MEASURING TESTING
Information Patent Grant
Spatial and temporal selective laser assisted fault localization
- Patent number 6,967,491
- Issue date Nov 22, 2005
- Credence Systems Corporation
- Philippe Perdu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods of using measured time resolved photon emission data and si...
- Publication number 20050024057
- Publication date Feb 3, 2005
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Spatial and temporal selective laser assisted fault localization
- Publication number 20050006602
- Publication date Jan 13, 2005
- Philippe Perdu
- G01 - MEASURING TESTING
Information Patent Application
PICA system detector calibration
- Publication number 20030156750
- Publication date Aug 21, 2003
- Girish Dajee
- G01 - MEASURING TESTING