Martin Eckert

Person

  • Boeblingen, DE

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    DEVICE FOR POSITIONING A SEMICONDUCTOR DIE IN A WAFER PROBER

    • Publication number 20210215738
    • Publication date Jul 15, 2021
    • International Business Machines Corporation
    • Otto Andreas Torreiter
    • G01 - MEASURING TESTING
  • Information Patent Application

    STRESSING INTEGRATED CIRCUITS USING A RADIATION SOURCE

    • Publication number 20210123969
    • Publication date Apr 29, 2021
    • International Business Machines Corporation
    • Martin Eckert
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    INTEGRATED CIRCUIT WITH OPTICAL TUNNEL

    • Publication number 20210066183
    • Publication date Mar 4, 2021
    • International Business Machines Corporation
    • Otto Andreas Torreiter
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD ALIGNMENT

    • Publication number 20190391179
    • Publication date Dec 26, 2019
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Application

    ADJUSTABLE LOAD TRANSMITTER

    • Publication number 20190204138
    • Publication date Jul 4, 2019
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTENT ADDRESSABLE MEMORY WITH MATCH HIT QUALITY INDICATION

    • Publication number 20190206492
    • Publication date Jul 4, 2019
    • International Business Machines Corporation
    • Martin ECKERT
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    FUNCTIONAL TESTING OF HIGH-SPEED SERIAL LINKS

    • Publication number 20190163596
    • Publication date May 30, 2019
    • International Business Machines Corporation
    • Martin Eckert
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    PROBE CARD ALIGNMENT

    • Publication number 20190018044
    • Publication date Jan 17, 2019
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Application

    ADJUSTABLE LOAD TRANSMITTER

    • Publication number 20190017861
    • Publication date Jan 17, 2019
    • International Business Machines Corporation
    • Martin Eckert
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    PROBE CARD ALIGNMENT

    • Publication number 20190018043
    • Publication date Jan 17, 2019
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTENT ADDRESSABLE MEMORY WITH MATCH HIT QUALITY INDICATION

    • Publication number 20180204618
    • Publication date Jul 19, 2018
    • International Business Machines Corporation
    • Martin ECKERT
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    LAYOUT EFFECT CHARACTERIZATION FOR INTEGRATED CIRCUITS

    • Publication number 20180107771
    • Publication date Apr 19, 2018
    • International Business Machines Corporation
    • Martin Eckert
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    CHIP ATTACH FRAME

    • Publication number 20170162534
    • Publication date Jun 8, 2017
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAFER PROBE ALIGNMENT

    • Publication number 20170108547
    • Publication date Apr 20, 2017
    • International Business Machines Corporation
    • Joerg G. APPINGER
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAFER PROBE ALIGNMENT

    • Publication number 20170108534
    • Publication date Apr 20, 2017
    • International Business Machines Corporation
    • Joerg G. APPINGER
    • G01 - MEASURING TESTING
  • Information Patent Application

    RAM AT SPEED FLEXIBLE TIMING AND SETUP CONTROL

    • Publication number 20170092341
    • Publication date Mar 30, 2017
    • International Business Machines Corporation
    • Martin Eckert
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    RAM AT SPEED FLEXIBLE TIMING AND SETUP CONTROL

    • Publication number 20170092377
    • Publication date Mar 30, 2017
    • International Business Machines Corporation
    • Martin Eckert
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    Module Testing Utilizing Wafer Probe Test Equipment

    • Publication number 20160365268
    • Publication date Dec 15, 2016
    • International Business Machines Corporation
    • Martin Eckert
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Module Testing Utilizing Wafer Probe Test Equipment

    • Publication number 20160363611
    • Publication date Dec 15, 2016
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Application

    SOLDERING THREE DIMENSIONAL INTEGRATED CIRCUITS

    • Publication number 20160293497
    • Publication date Oct 6, 2016
    • International Business Machines Corporation
    • Martin Eckert
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SYSTEM FOR ELECTRICAL TESTING AND MANUFACTURING OF A 3-D CHIP STACK...

    • Publication number 20160097807
    • Publication date Apr 7, 2016
    • International Business Machines Corporation
    • Martin ECKERT
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHIP ATTACH FRAME

    • Publication number 20150201537
    • Publication date Jul 16, 2015
    • International Business Machines Corporation
    • Martin Eckert
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    CHIP ATTACH FRAME

    • Publication number 20150059166
    • Publication date Mar 5, 2015
    • International Business Machines Corporation
    • Martin Eckert
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    POWER NOISE HISTOGRAM OF A COMPUTER SYSTEM

    • Publication number 20140316725
    • Publication date Oct 23, 2014
    • International Business Machines Corporation
    • Martin ECKERT
    • G01 - MEASURING TESTING
  • Information Patent Application

    SYSTEM FOR ELECTRICAL TESTING AND MANUFACTURING OF A 3-D CHIP STACK...

    • Publication number 20140300382
    • Publication date Oct 9, 2014
    • International Business Machines Corporation
    • Martin ECKERT
    • G01 - MEASURING TESTING
  • Information Patent Application

    NETWORK POWER FAULT DETECTION

    • Publication number 20130343200
    • Publication date Dec 26, 2013
    • Martin Eckert
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    CHIP ATTACH FRAME

    • Publication number 20130207250
    • Publication date Aug 15, 2013
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Application

    UPDATING INTERFACE SETTINGS FOR AN INTERFACE

    • Publication number 20120278519
    • Publication date Nov 1, 2012
    • International Business Machines Corporation
    • Frank W. Angelotti
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    DETERMINING LOCAL VOLTAGE IN AN ELECTRONIC SYSTEM

    • Publication number 20120146674
    • Publication date Jun 14, 2012
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASURING POWER CONSUMPTION IN AN INTEGRATED CIRCUIT

    • Publication number 20120130657
    • Publication date May 24, 2012
    • International Business Machines Corporation
    • Martin ECKERT
    • G01 - MEASURING TESTING