Martin F. Fay

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Middletown, CT, US

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Patents Grantslast 30 patents

Information Patent Grant
Calibration of scanning interferometers
- Patent number 9,958,254
- Issue date May 1, 2018
- Zygo Corporation
- Peter J. de Groot
- G02 - OPTICS
Information Patent Grant
Method and system for determining information about a transparent o...
- Patent number 9,658,129
- Issue date May 23, 2017
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Grant
Optical evaluation of lenses and lens molds
- Patent number 9,599,534
- Issue date Mar 21, 2017
- Zygo Corporation
- Martin F. Fay
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CALIBRATION OF SCANNING INTERFEROMETERS
- Publication number 20160047645
- Publication date Feb 18, 2016
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL EVALUATION OF LENSES AND LENS MOLDS
- Publication number 20160047711
- Publication date Feb 18, 2016
- Zygo Corporation
- Martin F. Fay
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL EVALUATION OF LENSES AND LENS MOLDS
- Publication number 20160047712
- Publication date Feb 18, 2016
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC METROLOGY OF SURFACES, FILMS AND UNDERRESOLVED STRU...
- Publication number 20120224183
- Publication date Sep 6, 2012
- Zygo Corporation
- Martin Fay
- G01 - MEASURING TESTING
Information Patent Application
DATA INTERPOLATION METHODS FOR METROLOGY OF SURFACES, FILMS AND UND...
- Publication number 20120089365
- Publication date Apr 12, 2012
- Zygo Corporation
- Martin Fay
- G01 - MEASURING TESTING