Martin Fischer

Person

Heilbronn, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-input multi-zone thermal control for device testing
- Patent number 12,203,979
- Issue date Jan 21, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-input multi-zone thermal control for device testing
- Patent number 11,852,678
- Issue date Dec 26, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-input multi-zone thermal control for device testing
- Patent number 11,573,262
- Issue date Feb 7, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G05 - CONTROLLING REGULATING
Information Patent Grant
Power supply, automated test equipment, method for operating a powe...
- Patent number 11,531,062
- Issue date Dec 20, 2022
- Advantest Corporation
- Franz Rottner
- G01 - MEASURING TESTING
Information Patent Grant
Scan speed optimization of input and output paths
- Patent number 9,977,081
- Issue date May 22, 2018
- Advantest Corporation
- Jurgen Serrer
- G01 - MEASURING TESTING
Information Patent Grant
Error detection in compressed data
- Patent number 8,473,796
- Issue date Jun 25, 2013
- Advantest (Singapore) Pte Ltd
- Martin Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Online documentation and help system for computer-based systems
- Patent number 6,208,338
- Issue date Mar 27, 2001
- Hewlett-Packard Company
- Martin Fischer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Means for virtual deskewing of high/intermediate/low DUT data
- Patent number 5,982,827
- Issue date Nov 9, 1999
- Hewlett-Packard Co.
- Barbara J. Duffner
- G01 - MEASURING TESTING
Information Patent Grant
Test vector generator comprising a decompression control unit and a...
- Patent number 5,499,248
- Issue date Mar 12, 1996
- Hewlett-Packard Company
- Klaus-Peter Behrens
- G11 - INFORMATION STORAGE
Information Patent Grant
Detector circuit for detecting state changes of a binary signal
- Patent number 5,336,944
- Issue date Aug 9, 1994
- Hewlett-Packard Company
- Martin Fischer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING
- Publication number 20230296667
- Publication date Sep 21, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G05 - CONTROLLING REGULATING
Information Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING MULTIPLE...
- Publication number 20230280394
- Publication date Sep 7, 2023
- Advantest Corporation
- Matthias WERNER
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING A SYNCHRO...
- Publication number 20230266380
- Publication date Aug 24, 2023
- Advantest Corporation
- Matthias WERNER
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING A BIDIREC...
- Publication number 20230184822
- Publication date Jun 15, 2023
- Advantest Corporation
- Matthias WERNER
- G01 - MEASURING TESTING
Information Patent Application
MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING
- Publication number 20230103082
- Publication date Mar 30, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING
- Publication number 20220206061
- Publication date Jun 30, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G05 - CONTROLLING REGULATING
Information Patent Application
POWER SUPPLY, AUTOMATED TEST EQUIPMENT, METHOD FOR OPERATING A POWE...
- Publication number 20200326372
- Publication date Oct 15, 2020
- Franz ROTTNER
- G01 - MEASURING TESTING
Information Patent Application
Scan Speed Optimization of Input and Output Paths
- Publication number 20160033574
- Publication date Feb 4, 2016
- Advantest Corporation
- Jurgen Serrer
- G01 - MEASURING TESTING
Information Patent Application
Error detection in compressed data
- Publication number 20060212770
- Publication date Sep 21, 2006
- AGILENT TECHNOLOGIES, INC.
- Martin Fischer
- G01 - MEASURING TESTING

Martin Fischer

Person

Patents Grantslast 30 patents

Multi-input multi-zone thermal control for device testing

Multi-input multi-zone thermal control for device testing

Multi-input multi-zone thermal control for device testing

Power supply, automated test equipment, method for operating a powe...

Scan speed optimization of input and output paths

Error detection in compressed data

Online documentation and help system for computer-based systems

Means for virtual deskewing of high/intermediate/low DUT data

Test vector generator comprising a decompression control unit and a...

Detector circuit for detecting state changes of a binary signal

Patents Applicationslast 30 patents

MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING

METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING MULTIPLE...

METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING A SYNCHRO...

METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING A BIDIREC...

MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING

MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING

POWER SUPPLY, AUTOMATED TEST EQUIPMENT, METHOD FOR OPERATING A POWE...

Scan Speed Optimization of Input and Output Paths

Error detection in compressed data