Martin Fritz

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Munchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing a plurality of devices disposed on a wafer and c...
- Patent number 6,917,214
- Issue date Jul 12, 2005
- Infineon Technologies AG
- Gerrit Farber
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for releasable contact-connection of a plurality of integrat...
- Patent number 6,773,934
- Issue date Aug 10, 2004
- Infineon Technologies AG
- Jens Möckel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for testing a plurality of devices
- Publication number 20030076127
- Publication date Apr 24, 2003
- Gerrit Farber
- G11 - INFORMATION STORAGE
Information Patent Application
Method for releasable contact-connection of a plurality of integrat...
- Publication number 20020137238
- Publication date Sep 26, 2002
- Jens Mockel
- G01 - MEASURING TESTING