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Martin Gruebele
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Champaign, IL, US
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last 30 patents
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Patent Grant
Particle dynamics microscopy using temperature jump and probe antic...
Patent number
8,757,871
Issue date
Jun 24, 2014
The Board of Trustees of the University of Illinois
Martin Gruebele
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SYSTEM AND METHOD FOR REDUCING SAMPLE NOISE USING SELECTIVE MARKERS
Publication number
20230408422
Publication date
Dec 21, 2023
KLA Corporation
Grace Hsiu-Ling Chen
G01 - MEASURING TESTING
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Patent Application
Particle Dynamics Microscopy using Temperature Jump and Probe Antic...
Publication number
20120039353
Publication date
Feb 16, 2012
THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
Martin Gruebele
G01 - MEASURING TESTING