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Martin I. Grace
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated multiple-up/down conversion radar test system
Patent number
6,700,531
Issue date
Mar 2, 2004
Anritsu Company
Ramzi Abou-Jaoude
G01 - MEASURING TESTING
Information
Patent Grant
Narrow band millimeter wave VNA for testing automotive collision av...
Patent number
6,411,252
Issue date
Jun 25, 2002
Anritsu Company
Martin I. Grace
G01 - MEASURING TESTING
Information
Patent Grant
Automotive radar antenna alignment system
Patent number
6,335,705
Issue date
Jan 1, 2002
Anritsu Company
Martin I. Grace
G01 - MEASURING TESTING
Information
Patent Grant
Automobile radar antenna alignment system using transponder and lasers
Patent number
6,329,952
Issue date
Dec 11, 2001
Anritsu Company
Martin I. Grace
G01 - MEASURING TESTING
Information
Patent Grant
Wafer probe with built in RF frequency conversion module
Patent number
6,169,410
Issue date
Jan 2, 2001
Anritsu Company
Martin I. Grace
G01 - MEASURING TESTING
Information
Patent Grant
Universal autoradar antenna alignment system
Patent number
6,087,995
Issue date
Jul 11, 2000
Anritsu Company
Martin I. Grace
G01 - MEASURING TESTING
Information
Patent Grant
Radar test system for collision avoidance automotive radar
Patent number
5,920,281
Issue date
Jul 6, 1999
Wiltron Company
Martin I. Grace
G01 - MEASURING TESTING
Information
Patent Grant
Internal automatic calibrator for vector network analyzers
Patent number
5,715,183
Issue date
Feb 3, 1998
Wiltron Company
Martin I. Grace
G01 - MEASURING TESTING
Information
Patent Grant
Internal automatic calibrator for vector network analyzers
Patent number
5,548,538
Issue date
Aug 20, 1996
Wiltron Company
Martin I. Grace
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring the phase and magnitude of micro...
Patent number
5,524,281
Issue date
Jun 4, 1996
Wiltron Company
Donald A. Bradley
G01 - MEASURING TESTING
Information
Patent Grant
Multiple magnetically tuned oscillator
Patent number
5,200,713
Issue date
Apr 6, 1993
Wiltron Company
Martin I. Grace
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Measuring noise figure and y-factor
Patent number
5,191,294
Issue date
Mar 2, 1993
Wiltron Company
Martin I. Grace
G01 - MEASURING TESTING
Information
Patent Grant
Multiple YIG oscillator
Patent number
5,115,209
Issue date
May 19, 1992
Wiltron Company
Martin I. Grace
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for increasing the high frequency sensitivity...
Patent number
5,113,094
Issue date
May 12, 1992
Wiltron Company
Martin I. Grace
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Vector network analyzer RF pulse profiling method and apparatus
Patent number
5,059,915
Issue date
Oct 22, 1991
Wiltron Company
Martin I. Grace
G01 - MEASURING TESTING
Information
Patent Grant
Asymmetrical coupling circuit
Patent number
4,808,913
Issue date
Feb 28, 1989
Wiltron Company
Martin I. Grace
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED MULTIPLE-UP/DOWN CONVERSION RADAR TEST SYSTEM
Publication number
20040012517
Publication date
Jan 22, 2004
Ramzi Abou-Jaoude
G01 - MEASURING TESTING