Martin Jules Marie-Emile DE NIVELLE

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Waalre, NL

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring substrate height
- Patent number 11,662,669
- Issue date May 30, 2023
- ASML Netherlands B.V.
- Andrey Valerievich Rogachevskiy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Level sensor apparatus, method of measuring topographical variation...
- Patent number 11,029,614
- Issue date Jun 8, 2021
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE LEVEL SENSING IN A LITHOGRAPHIC APPARATUS
- Publication number 20230384698
- Publication date Nov 30, 2023
- ASML NETHERLANDS B.V.
- Martin Jules Marie-Emile DE NIVELLE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS AND METHOD FOR MEASURING SUBSTRATE HEIGHT
- Publication number 20220244651
- Publication date Aug 4, 2022
- ASML NETHERLANDS B.V.
- Andrey Valerievich ROGACHEVSKIY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LEVEL SENSOR APPARATUS, METHOD OF MEASURING TOPOGRAPHICAL VARIATION...
- Publication number 20190243259
- Publication date Aug 8, 2019
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G05 - CONTROLLING REGULATING