Martin Kadner

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Hamburg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and circuit arrangement for the self-testing of a reference...
- Patent number 7,394,239
- Issue date Jul 1, 2008
- NXP B.V.
- Martin Kadner
- G01 - MEASURING TESTING
Information Patent Grant
Phase detector and method of phase detection
- Patent number 7,339,365
- Issue date Mar 4, 2008
- NXP B.V.
- Martin Kadner
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and circuit arrangement for the self-testing of a reference...
- Patent number 7,183,773
- Issue date Feb 27, 2007
- NXP B.V.
- Martin Kadner
- G01 - MEASURING TESTING
Information Patent Grant
Circuit arrangement with a resistor voltage divider chain
- Patent number 7,119,529
- Issue date Oct 10, 2006
- Koninklijke Philips Electronics N.V.
- Martin Kadner
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT ARRANGEMENT AND CORRESPONDING METHOD FOR VOLTAGE REFERENCE...
- Publication number 20090174392
- Publication date Jul 9, 2009
- NXP B.V.
- Martin Kadner
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and Circuit Arrangement for the Self-Testing of a Reference...
- Publication number 20070216395
- Publication date Sep 20, 2007
- Koninklijke Philips Electronics N.V.
- Martin Kadner
- G01 - MEASURING TESTING
Information Patent Application
Method and circuit arrangement for the self-testing of a reference...
- Publication number 20060181282
- Publication date Aug 17, 2006
- Koninklije Philips Electronics, N.V.
- Martin Kadner
- G01 - MEASURING TESTING
Information Patent Application
Phase detector and method of phase detection
- Publication number 20060145682
- Publication date Jul 6, 2006
- Koninklijke Philips Electronics N.V.
- Martin Kadner
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Circuit arrangement with a resistor voltage divider chain
- Publication number 20050012495
- Publication date Jan 20, 2005
- Martin Kadner
- G05 - CONTROLLING REGULATING