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Martin Kefer
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Shanghai, CN
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Patents Grants
last 30 patents
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Patent Grant
Tilt detection apparatus and method thereof
Patent number
11,493,338
Issue date
Nov 8, 2022
ABB Schweiz AG
Hao Gu
G01 - MEASURING TESTING
Information
Patent Grant
Object multi-perspective inspection apparatus and method therefor
Patent number
10,788,429
Issue date
Sep 29, 2020
ABB Schweiz AG
Martin Kefer
G01 - MEASURING TESTING
Information
Patent Grant
Object multi-perspective inspection apparatus and method therefor
Patent number
10,488,346
Issue date
Nov 26, 2019
ABB Schweiz AG
Martin Kefer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
OBJECT MULTI-PERSPECTIVE INSPECTION APPARATUS AND METHOD THEREFOR
Publication number
20200132609
Publication date
Apr 30, 2020
ABB Schweiz AG
Martin Kefer
G01 - MEASURING TESTING
Information
Patent Application
TILT DETECTION APPARATUS AND METHOD THEREOF
Publication number
20190049244
Publication date
Feb 14, 2019
ABB Schweiz AG
Hao Gu
G01 - MEASURING TESTING
Information
Patent Application
OBJECT MULTI-PERSPECTIVE INSPECTION APPARATUS AND METHOD THEREFOR
Publication number
20180188184
Publication date
Jul 5, 2018
ABB Schweiz AG
Martin Kefer
G01 - MEASURING TESTING