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Martin MANGSTL
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Munchen, DE
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last 30 patents
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Patent Grant
Method and apparatus for monitoring a spectral radiometer
Patent number
11,598,668
Issue date
Mar 7, 2023
Instrument Systems Optische Messtechnik GmbH
Matthias Hoeh
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Device and Method for Measuring Semiconductor-Based Light Sources
Publication number
20210396575
Publication date
Dec 23, 2021
INSTRUMENT SYSTEMS OPTISCHE MESSTECHNIK GmbH
Reto HÄRING
G01 - MEASURING TESTING
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Patent Application
METHOD AND APPARATUS FOR MONITORING A SPECTRAL RADIOMETER
Publication number
20210270670
Publication date
Sep 2, 2021
INSTRUMENT SYSTEMS OPTISCHE MESSTECHNIK GmbH
Mathias HOH
G01 - MEASURING TESTING