Martin Nonnenmacher deceased

Person

late of Schoenaich, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method of producing a calibration standard for 2-D and 3-D profilom...
- Patent number 6,218,264
- Issue date Apr 17, 2001
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibration standard for 2-D and 3-D profilometry in the sub-nanome...
- Patent number 5,960,255
- Issue date Sep 28, 1999
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibration standard for 2-D and 3-D profilometry in the sub-nanome...
- Patent number 5,665,905
- Issue date Sep 9, 1997
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Force microscope and method for measuring atomic forces in multiple...
- Patent number 5,646,339
- Issue date Jul 8, 1997
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibration standard for 2-D and 3-D profilometry in the sub-nanome...
- Patent number 5,534,359
- Issue date Jul 9, 1996
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Pneumatically and electrostatically driven scanning tunneling micro...
- Patent number 5,283,437
- Issue date Feb 1, 1994
- International Business Machines Corporation
- Johann Greschner
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Feedback controlled differential fiber interferometer
- Patent number 5,280,341
- Issue date Jan 18, 1994
- International Business Machines Corporation
- Martin Nonnenmacher
- B82 - NANO-TECHNOLOGY

Martin Nonnenmacher deceased

Person

Patents Grantslast 30 patents

Method of producing a calibration standard for 2-D and 3-D profilom...

Calibration standard for 2-D and 3-D profilometry in the sub-nanome...

Calibration standard for 2-D and 3-D profilometry in the sub-nanome...

Force microscope and method for measuring atomic forces in multiple...

Calibration standard for 2-D and 3-D profilometry in the sub-nanome...

Pneumatically and electrostatically driven scanning tunneling micro...

Feedback controlled differential fiber interferometer