Martin Perner

Person

Munich, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for testing memory
- Patent number 11,742,048
- Issue date Aug 29, 2023
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing memory cells by allocating an access value to a memory acce...
- Patent number 11,238,948
- Issue date Feb 1, 2022
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing memory cells by allocating an access value to a memory acce...
- Patent number 10,916,322
- Issue date Feb 9, 2021
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of operating a memory unit sector
- Patent number 10,395,729
- Issue date Aug 27, 2019
- Infineon Technologies AG
- Martin Perner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory unit and method of operating a memory unit sector
- Patent number 10,083,743
- Issue date Sep 25, 2018
- Infineon Technologies AG
- Martin Perner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory unit and method of operating a memory unit sector
- Patent number 9,941,000
- Issue date Apr 10, 2018
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Buffer circuit for a memory module
- Patent number 7,778,090
- Issue date Aug 17, 2010
- Qimonda AG
- Martin Perner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic memory apparatus and method for operating an electronic...
- Patent number 7,403,440
- Issue date Jul 22, 2008
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile memory cell and methods for operating a nonvolatile mem...
- Patent number 7,385,837
- Issue date Jun 10, 2008
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and method for testing memory devices with repairable...
- Patent number 7,349,253
- Issue date Mar 25, 2008
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconductor memory
- Patent number 7,337,284
- Issue date Feb 26, 2008
- Infineon Technologies, AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Inputting and outputting operating parameters for an integrated sem...
- Patent number 7,330,378
- Issue date Feb 12, 2008
- Infineon Technologies, AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory arrangement in a computer system
- Patent number 7,313,732
- Issue date Dec 25, 2007
- Infineon Technologies AG
- Martin Perner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated semiconductor memory device with test circuit for sense...
- Patent number 7,286,427
- Issue date Oct 23, 2007
- Infineon Technologies, AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor circuit and method for testing, monitoring and applic...
- Patent number 7,249,301
- Issue date Jul 24, 2007
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconductor memory device
- Patent number 7,248,530
- Issue date Jul 24, 2007
- Infineon Technologies, AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory module and method for operating a memory module
- Patent number 7,202,545
- Issue date Apr 10, 2007
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconductor memory with redundant memory cells
- Patent number 7,203,106
- Issue date Apr 10, 2007
- Infineon Technologies AG
- Martin Versen
- G11 - INFORMATION STORAGE
Information Patent Grant
Semi-conductor component, as well as a process for the in-or output...
- Patent number 7,184,339
- Issue date Feb 27, 2007
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for refreshing memory cells of a dynamic memory
- Patent number 7,123,533
- Issue date Oct 17, 2006
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated memory and method for checking the functioning of an int...
- Patent number 7,082,513
- Issue date Jul 25, 2006
- Infineon Technologies AG
- Dirk Fuhrmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit configuration and method for measuring at least one operati...
- Patent number 7,071,676
- Issue date Jul 4, 2006
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for evaluating and controlling a refresh rate of...
- Patent number 7,057,961
- Issue date Jun 6, 2006
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconductor memory
- Patent number 7,057,201
- Issue date Jun 6, 2006
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor module and methods for functionally testing and confi...
- Patent number 7,009,417
- Issue date Mar 7, 2006
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for refreshing memory cells of a dynamic memory
- Patent number 6,999,369
- Issue date Feb 14, 2006
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for data transmission
- Patent number 6,996,187
- Issue date Feb 7, 2006
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for determining at least one voltage, current an...
- Patent number 6,992,475
- Issue date Jan 31, 2006
- Infineon Technologies AG
- Martin Perner
- G01 - MEASURING TESTING
Information Patent Grant
Integrated dynamic memory and operating method
- Patent number 6,940,774
- Issue date Sep 6, 2005
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for operating a semiconductor memory, and semiconductor memory
- Patent number 6,882,584
- Issue date Apr 19, 2005
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING MEMORY
- Publication number 20220059180
- Publication date Feb 24, 2022
- INFINEON TECHNOLOGIES AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING MEMORY CELLS BY ALLOCATING AN ACCESS VALUE TO A MEMORY ACCE...
- Publication number 20210158882
- Publication date May 27, 2021
- INFINEON TECHNOLOGIES AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING MEMORY CELLS
- Publication number 20190066813
- Publication date Feb 28, 2019
- INFINEON TECHNOLOGIES AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF OPERATING A MEMORY UNIT SECTOR
- Publication number 20180358089
- Publication date Dec 13, 2018
- INFINEON TECHNOLOGIES AG
- Martin Perner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF OPERATING A MEMORY UNIT SECTOR
- Publication number 20180226124
- Publication date Aug 9, 2018
- INFINEON TECHNOLOGIES AG
- Martin Perner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY UNIT AND METHOD OF OPERATING A MEMORY UNIT SECTOR
- Publication number 20170098472
- Publication date Apr 6, 2017
- INFINEON TECHNOLOGIES AG
- Martin Perner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUITRY AND METHOD FOR TESTING AN ERROR-CORRECTION CAPABILITY
- Publication number 20160364280
- Publication date Dec 15, 2016
- INFINEON TECHNOLOGIES AG
- Martin Perner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Buffer circuit for a memory module
- Publication number 20090049267
- Publication date Feb 19, 2009
- Martin Perner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electronic memory apparatus and method for operating an electronic...
- Publication number 20060280012
- Publication date Dec 14, 2006
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Memory device and method for testing memory devices with repairable...
- Publication number 20060198215
- Publication date Sep 7, 2006
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated semiconductor memory device with test circuit for sense...
- Publication number 20060152982
- Publication date Jul 13, 2006
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Inputting and outputting operating parameters for an integrated sem...
- Publication number 20060120139
- Publication date Jun 8, 2006
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated semiconductor memory device
- Publication number 20060109705
- Publication date May 25, 2006
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Semi-conductor component, as well as a process for the in-or output...
- Publication number 20060087900
- Publication date Apr 27, 2006
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Application
Nonvolatile memory cell and methods for operating a nonvolatile mem...
- Publication number 20060083050
- Publication date Apr 20, 2006
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated semiconductor memory with redundant memory cells
- Publication number 20060023556
- Publication date Feb 2, 2006
- Martin Versen
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated semiconductor memory
- Publication number 20060023523
- Publication date Feb 2, 2006
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Memory module and method for operating a memory module
- Publication number 20050098881
- Publication date May 12, 2005
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated semiconductor memory
- Publication number 20050094461
- Publication date May 5, 2005
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit and method for evaluating and controlling a refresh rate of...
- Publication number 20050041502
- Publication date Feb 24, 2005
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit and method for refreshing memory cells of a dynamic memory
- Publication number 20050030807
- Publication date Feb 10, 2005
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit and method for refreshing memory cells of a dynamic memory
- Publication number 20050030806
- Publication date Feb 10, 2005
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor circuit and method for testing, monitoring and applic...
- Publication number 20050028058
- Publication date Feb 3, 2005
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Memory arrangement in a computer system
- Publication number 20050028040
- Publication date Feb 3, 2005
- Martin Perner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuit and method for determining at least one voltage, current an...
- Publication number 20040140818
- Publication date Jul 22, 2004
- Martin Perner
- G01 - MEASURING TESTING
Information Patent Application
Circuit configuration and method for measuring at least one operati...
- Publication number 20040100246
- Publication date May 27, 2004
- Martin Perner
- G01 - MEASURING TESTING
Information Patent Application
Integrated dynamic memory and operating method
- Publication number 20040090853
- Publication date May 13, 2004
- Infineon Technologies AG
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor module and methods for functionally testing and confi...
- Publication number 20040082121
- Publication date Apr 29, 2004
- Martin Perner
- G11 - INFORMATION STORAGE
Information Patent Application
Self-test circuit and a method for testing a memory with the self-t...
- Publication number 20040057307
- Publication date Mar 25, 2004
- Dirk Fuhrmann
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated memory and method for checking the functioning of an int...
- Publication number 20040052132
- Publication date Mar 18, 2004
- Dirk Fuhrmann
- G11 - INFORMATION STORAGE

Martin Perner

Person

Patents Grantslast 30 patents

Method for testing memory

Testing memory cells by allocating an access value to a memory acce...

Testing memory cells by allocating an access value to a memory acce...

Method of operating a memory unit sector

Memory unit and method of operating a memory unit sector

Memory unit and method of operating a memory unit sector

Buffer circuit for a memory module

Electronic memory apparatus and method for operating an electronic...

Nonvolatile memory cell and methods for operating a nonvolatile mem...

Memory device and method for testing memory devices with repairable...

Integrated semiconductor memory

Inputting and outputting operating parameters for an integrated sem...

Memory arrangement in a computer system

Integrated semiconductor memory device with test circuit for sense...

Semiconductor circuit and method for testing, monitoring and applic...

Integrated semiconductor memory device

Memory module and method for operating a memory module

Integrated semiconductor memory with redundant memory cells

Semi-conductor component, as well as a process for the in-or output...

Circuit and method for refreshing memory cells of a dynamic memory

Integrated memory and method for checking the functioning of an int...

Circuit configuration and method for measuring at least one operati...

Circuit and method for evaluating and controlling a refresh rate of...

Integrated semiconductor memory

Semiconductor module and methods for functionally testing and confi...

Circuit and method for refreshing memory cells of a dynamic memory

Method and apparatus for data transmission

Circuit and method for determining at least one voltage, current an...

Integrated dynamic memory and operating method

Method for operating a semiconductor memory, and semiconductor memory

Patents Applicationslast 30 patents

METHOD FOR TESTING MEMORY

TESTING MEMORY CELLS BY ALLOCATING AN ACCESS VALUE TO A MEMORY ACCE...

TESTING MEMORY CELLS

METHOD OF OPERATING A MEMORY UNIT SECTOR

METHOD OF OPERATING A MEMORY UNIT SECTOR

MEMORY UNIT AND METHOD OF OPERATING A MEMORY UNIT SECTOR

CIRCUITRY AND METHOD FOR TESTING AN ERROR-CORRECTION CAPABILITY

Buffer circuit for a memory module

Electronic memory apparatus and method for operating an electronic...

Memory device and method for testing memory devices with repairable...

Integrated semiconductor memory device with test circuit for sense...

Inputting and outputting operating parameters for an integrated sem...

Integrated semiconductor memory device

Semi-conductor component, as well as a process for the in-or output...

Nonvolatile memory cell and methods for operating a nonvolatile mem...

Integrated semiconductor memory with redundant memory cells

Integrated semiconductor memory

Memory module and method for operating a memory module

Integrated semiconductor memory

Circuit and method for evaluating and controlling a refresh rate of...

Circuit and method for refreshing memory cells of a dynamic memory

Circuit and method for refreshing memory cells of a dynamic memory

Semiconductor circuit and method for testing, monitoring and applic...

Memory arrangement in a computer system

Circuit and method for determining at least one voltage, current an...

Circuit configuration and method for measuring at least one operati...

Integrated dynamic memory and operating method

Semiconductor module and methods for functionally testing and confi...

Self-test circuit and a method for testing a memory with the self-t...

Integrated memory and method for checking the functioning of an int...