Martin Priwisch

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and method of inspecting wafer
- Patent number 12,196,669
- Issue date Jan 14, 2025
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method using same
- Patent number 11,946,881
- Issue date Apr 2, 2024
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TERAHERTZ PROBE
- Publication number 20230417820
- Publication date Dec 28, 2023
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER
- Publication number 20230204503
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD USING SAME
- Publication number 20220412898
- Publication date Dec 29, 2022
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- H01 - BASIC ELECTRIC ELEMENTS