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Martin St-Laurent
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Quebec, CA
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Patents Grants
last 30 patents
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Patent Grant
System and method of non-destructive inspection with a visual scann...
Patent number
10,156,548
Issue date
Dec 18, 2018
Olympus Scientific Solutions Americas Inc.
Pierre Langlois
G01 - MEASURING TESTING
Information
Patent Grant
System and method of dynamic gating in non-destructive weld inspection
Patent number
9,759,692
Issue date
Sep 12, 2017
Olympus Scientific Solutions Americas Inc.
Martin St-Laurent
G01 - MEASURING TESTING
Information
Patent Grant
System and method of correcting a non-concentric ultrasonic iris in...
Patent number
9,726,641
Issue date
Aug 8, 2017
Olympus Scientific Solutions Americas Inc.
Tommy Bourgelas
G01 - MEASURING TESTING
Information
Patent Grant
System and a method of automatically generating a phased array ultr...
Patent number
9,625,424
Issue date
Apr 18, 2017
Olympus Scientific Solutions Americas Inc.
Benoit LePage
G01 - MEASURING TESTING
Information
Patent Grant
Sizing of a defect using phased array system
Patent number
9,222,918
Issue date
Dec 29, 2015
Olympus Scientific Solutions Americas Inc.
Martin St-Laurent
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PHASED ARRAY WELD INSPECTION SYSTEM WITH ASSISTED ANALYSIS TOOLS
Publication number
20180113100
Publication date
Apr 26, 2018
Olympus Scientific Solutions Americas Inc.
Martin St-Laurent
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF AUTOMATICALLY GENERATING A PHASED ARRAY ULTRAS...
Publication number
20160238566
Publication date
Aug 18, 2016
Olympus Scientific Solutions Americas Inc.
Benoit LePage
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF CORRECTING A NON-CONCENTRIC ULTRASONIC IRIS IN...
Publication number
20160069995
Publication date
Mar 10, 2016
OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS, INC
Tommy Bourgelas
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF DYNAMIC GATING IN NON-DESTRUCTIVE WELD INSPECTION
Publication number
20150346164
Publication date
Dec 3, 2015
Olympus Scientific Solutions Americas Inc.
Martin St-Laurent
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF NON-DESTRUCTIVE INSPECTION WITH A VISUAL SCANN...
Publication number
20150039245
Publication date
Feb 5, 2015
Olympus NDT Inc.
Pierre Langlois
G01 - MEASURING TESTING
Information
Patent Application
SIZING OF A DEFECT USING PHASED ARRAY SYSTEM
Publication number
20140236499
Publication date
Aug 21, 2014
OLYMPUS NDT, INC.
Martin St-Laurent
G01 - MEASURING TESTING