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Martin Thomas Amodeo
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Santa Clara, CA, US
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last 30 patents
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Patent Grant
Diagnosing multicycle transition faults and/or defects with AT-spee...
Patent number
11,892,501
Issue date
Feb 6, 2024
Cadence Design Systems, Inc.
Arvind Chokhani
G01 - MEASURING TESTING
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Patent Grant
Utilizing transition ATPG test patterns to detect multicycle faults...
Patent number
11,893,336
Issue date
Feb 6, 2024
Cadence Design Systems, Inc.
Arvind Chokhani
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Diagnosing multicycle faults and/or defects with single cycle ATPG...
Patent number
11,740,284
Issue date
Aug 29, 2023
Cadence Design Systems, Inc.
Arvind Chokhani
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Utilizing single cycle ATPG test patterns to detect multicycle cell...
Patent number
11,579,194
Issue date
Feb 14, 2023
Cadence Design Systems, Inc.
Arvind Chokhani
G01 - MEASURING TESTING