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Martin Verheijen
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Geldrop, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Method of imaging a sample using an electron microscope
Patent number
10,937,625
Issue date
Mar 2, 2021
FEI Company
Erik Michiel Franken
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of calibrating a scanning transmission charged-particle micr...
Patent number
9,396,907
Issue date
Jul 19, 2016
FEI Company
Maximus Theodorus Otten
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of measuring the temperature of a sample carrier in a charge...
Patent number
8,757,873
Issue date
Jun 24, 2014
FEI Company
Stephanus Hubertus Leonardus van den Boom
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
THERMAL DRIFT CORRECTION BASED ON THERMAL MODELING
Publication number
20230184696
Publication date
Jun 15, 2023
FEI Company
Hugo VAN LEEUWEN
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF IMAGING A SAMPLE USING AN ELECTRON MICROSCOPE
Publication number
20200168433
Publication date
May 28, 2020
FEI Company
Erik Michiel Franken
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF CALIBRATING A SCANNING TRANSMISSION CHARGED-PARTICLE MICR...
Publication number
20160013016
Publication date
Jan 14, 2016
FEI Company
Maximus Theodorus Otten
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Measuring the Temperature of a Sample Carrier in a Charge...
Publication number
20120128028
Publication date
May 24, 2012
FEI Company
Stephanus Hubertus Leonardus van den Boom
G01 - MEASURING TESTING