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Martin Villafana
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San Diego, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Visible laser circuit fault isolation
Patent number
10,132,861
Issue date
Nov 20, 2018
QUALCOMM Incorporated
Rama Rao Goruganthu
G01 - MEASURING TESTING
Information
Patent Grant
Minimum voltage and maximum performance mapping using laser-assiste...
Patent number
9,599,666
Issue date
Mar 21, 2017
QUALCOMM Incorporated
Lavakumar Ranganathan
G01 - MEASURING TESTING
Information
Patent Grant
Techniques employing light-emitting circuits
Patent number
8,451,009
Issue date
May 28, 2013
QUALCOMM Incorporated
Martin L. Villafana
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Techniques providing fiducial markers for failure analysis
Patent number
8,420,410
Issue date
Apr 16, 2013
QUALCOMM Incorporated
Michael Laisne
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Reliability of vias and diagnosis by e-beam probing
Patent number
6,573,735
Issue date
Jun 3, 2003
QUALCOMM Incorporated
William Xia
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
VISIBLE LASER CIRCUIT FAULT ISOLATION
Publication number
20180080983
Publication date
Mar 22, 2018
QUALCOMM Incorporated
Rama Rao Goruganthu
G01 - MEASURING TESTING
Information
Patent Application
MINIMUM VOLTAGE AND MAXIMUM PERFORMANCE MAPPING USING LASER-ASSISTE...
Publication number
20160116531
Publication date
Apr 28, 2016
QUALCOMM Incorporated
Lavakumar Ranganathan
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TEMPERATURE CONTROLLED ELECTRICAL AND OPTICAL PROBE F...
Publication number
20140361799
Publication date
Dec 11, 2014
QUALCOMM Incorporated
Armand Anthony Graupera
G01 - MEASURING TESTING
Information
Patent Application
ASSEMBLY FOR OPTICAL BACKSIDE FAILURE ANALYSIS OF PACKAGE-ON-PACKAG...
Publication number
20140159758
Publication date
Jun 12, 2014
QUALCOMM Incorporated
Himaja H. Bhatt
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT AND METHOD FOR TESTING INSULATING MATERIAL
Publication number
20120212245
Publication date
Aug 23, 2012
QUALCOMM Incorporated
Angelo Pinto
G01 - MEASURING TESTING
Information
Patent Application
TECHNIQUES PROVIDING FIDUCIAL MARKERS FOR FAILURE ANALYSIS
Publication number
20110164808
Publication date
Jul 7, 2011
QUALCOMM Incorporated
Michael Laisne
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Techniques Employing Light-Emitting Circuits
Publication number
20110101991
Publication date
May 5, 2011
QUALCOMM Incorporated
Martin L. Villafana
G01 - MEASURING TESTING
Information
Patent Application
Reliability of vias and diagnosis by E-beam probing
Publication number
20020186028
Publication date
Dec 12, 2002
William Xia
G01 - MEASURING TESTING