Martin Von Haartman

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Portland, OR, US

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Patents Applicationslast 30 patents

Information Patent Application
ENHANCED ELECTRON BEAM (E-BEAM) APPARATUS AND METHODOLOGY WITH NANO...
- Publication number 20240219460
- Publication date Jul 4, 2024
- Xianghong TONG
- G01 - MEASURING TESTING
Information Patent Application
TESTING A SEMICONDUCTOR DEVICE USING X-RAYS
- Publication number 20240103072
- Publication date Mar 28, 2024
- Intel Corporation
- Patrick PARDY
- G01 - MEASURING TESTING
Information Patent Application
GATE-ALL-AROUND TRANSISTOR CIRCUIT MODIFICATION USING DIRECT CONTAC...
- Publication number 20240006302
- Publication date Jan 4, 2024
- Intel Corporation
- Richard H. Livengood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STROBOSCOPIC ELECTRON-BEAM SIGNAL IMAGE MAPPING
- Publication number 20230317408
- Publication date Oct 5, 2023
- Intel Corporation
- Xianghong Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER LEVEL ELECTRON BEAM PROBER
- Publication number 20230305057
- Publication date Sep 28, 2023
- Intel Corporation
- Xianghong Tong
- G01 - MEASURING TESTING