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Martin Wagner
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Santa Barbara, CA, US
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last 30 patents
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Patent Grant
Torsion wing probe assembly
Patent number
11,555,827
Issue date
Jan 17, 2023
Bruker Nano, Inc.
Shuiqing Hu
G01 - MEASURING TESTING
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Patent Grant
Torsion wing probe assembly
Patent number
11,119,118
Issue date
Sep 14, 2021
Bruker Nano, Inc.
Shuiqing Hu
G01 - MEASURING TESTING
Information
Patent Grant
Infrared characterization of a sample using oscillating mode
Patent number
10,845,382
Issue date
Nov 24, 2020
Chanmin Su
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Nano-Mechanical Infrared Spectroscopy System and Method Using Gated...
Publication number
20240168053
Publication date
May 23, 2024
Bruker Nano, Inc.
Martin Wagner
G01 - MEASURING TESTING
Information
Patent Application
Torsion Wing Probe Assembly
Publication number
20200348333
Publication date
Nov 5, 2020
Bruke Nano, Inc.
Shuiqing Hu
G01 - MEASURING TESTING
Information
Patent Application
Infrared Characterization of a Sample Using Oscillating Mode
Publication number
20180052186
Publication date
Feb 22, 2018
Bruker Nano, Inc.
Chanmin Su
G01 - MEASURING TESTING
Information
Patent Application
SNOM SYSTEM WITH LASER-DRIVEN PLASMA SOURCE
Publication number
20170067934
Publication date
Mar 9, 2017
Xiaoji Xu
G01 - MEASURING TESTING