Martin Wendel

Person

Munchen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Avalanche diode having an enhanced defect concentration level and m...
- Patent number 10,756,081
- Issue date Aug 25, 2020
- Infineon Technologies AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Avalanche diode having an enhanced defect concentration level and m...
- Patent number 9,812,438
- Issue date Nov 7, 2017
- Infineon Technologies AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Avalanche diode having an enhanced defect concentration level and m...
- Patent number 9,257,523
- Issue date Feb 9, 2016
- Infineon Technologies AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Avalanche diode having an enhanced defect concentration level and m...
- Patent number 8,791,547
- Issue date Jul 29, 2014
- Infineon Technologies AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic component and a system and method for producing an elect...
- Patent number 8,710,590
- Issue date Apr 29, 2014
- Infineon Technologies AG
- Philipp Riess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of use and formation of a lateral bipolar transistor with c...
- Patent number 8,043,934
- Issue date Oct 25, 2011
- Infineon Technologies AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lateral bipolar transistor with additional ESD implant
- Patent number 7,875,933
- Issue date Jan 25, 2011
- Infineon Technologies AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection device and method
- Patent number 7,709,896
- Issue date May 4, 2010
- Infineon Technologies AG
- Cornelius Christian Russ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit for protecting integrated circuits against electrostatic di...
- Patent number 7,359,169
- Issue date Apr 15, 2008
- Infineon Technologies AG
- Kai Esmark
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
ESD protective circuit with collector-current-controlled triggering...
- Patent number 7,087,938
- Issue date Aug 8, 2006
- Infineon Technologies AG
- Martin Streibl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for testing the ESD resistance of a semiconductor...
- Patent number 7,009,404
- Issue date Mar 7, 2006
- Infineon Technologies AG
- Martin Wendel
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining an ESD/latch-up strength of an integrated ci...
- Patent number 6,930,501
- Issue date Aug 16, 2005
- Infineon Technologies AG
- Silke Bargstädt-Franke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operating method for a semiconductor component
- Patent number 6,905,892
- Issue date Jun 14, 2005
- Infineon Technologies AG
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor with ESD protection
- Patent number 6,559,503
- Issue date May 6, 2003
- Infineon Technologies AG
- Martin Wendel
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Avalanche Diode Having an Enhanced Defect Concentration Level and M...
- Publication number 20180033783
- Publication date Feb 1, 2018
- INFINEON TECHNOLOGIES AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Avalanche Diode Having an Enhanced Defect Concentration Level and M...
- Publication number 20160111413
- Publication date Apr 21, 2016
- INFINEON TECHNOLOGIES AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Avalanche Diode Having an Enhanced Defect Concentration Level and M...
- Publication number 20140291808
- Publication date Oct 2, 2014
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lateral Bipolar Transistor with Additional ESD Implant
- Publication number 20110038085
- Publication date Feb 17, 2011
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD/EOS Performance by Introduction of Defects
- Publication number 20090185316
- Publication date Jul 23, 2009
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD protection device and method
- Publication number 20070210387
- Publication date Sep 13, 2007
- Cornelius Christian Russ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electronic component and a system and method for producing an elect...
- Publication number 20070010077
- Publication date Jan 11, 2007
- Philipp Riess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lateral bipolar transistor with additional ESD implant
- Publication number 20060226488
- Publication date Oct 12, 2006
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit for protecting integrated circuits against electrostatic di...
- Publication number 20060056121
- Publication date Mar 16, 2006
- Kai Esmark
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Transistor comprising fill areas in the source drain and/or drain r...
- Publication number 20050263817
- Publication date Dec 1, 2005
- Martin Wendel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD protective circuit with collector-current-controlled triggering...
- Publication number 20050195540
- Publication date Sep 8, 2005
- Martin Streibl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for determining an ESD/latch-up strength of an integrated ci...
- Publication number 20050003564
- Publication date Jan 6, 2005
- Silke Bargstadt-Franke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Operating method for a semiconductor component
- Publication number 20030017676
- Publication date Jan 23, 2003
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for testing the ESD resistance of a semiconductor...
- Publication number 20030006776
- Publication date Jan 9, 2003
- Infineon Technologies AG, Germany
- Martin Wendel
- G01 - MEASURING TESTING
Information Patent Application
Transistor with ESD protection
- Publication number 20020093102
- Publication date Jul 18, 2002
- Martin Wendel
- H01 - BASIC ELECTRIC ELEMENTS

Martin Wendel

Person

Patents Grantslast 30 patents

Avalanche diode having an enhanced defect concentration level and m...

Avalanche diode having an enhanced defect concentration level and m...

Avalanche diode having an enhanced defect concentration level and m...

Avalanche diode having an enhanced defect concentration level and m...

Electronic component and a system and method for producing an elect...

Methods of use and formation of a lateral bipolar transistor with c...

Lateral bipolar transistor with additional ESD implant

ESD protection device and method

Circuit for protecting integrated circuits against electrostatic di...

ESD protective circuit with collector-current-controlled triggering...

Method and device for testing the ESD resistance of a semiconductor...

Method for determining an ESD/latch-up strength of an integrated ci...

Operating method for a semiconductor component

Transistor with ESD protection

Patents Applicationslast 30 patents

Avalanche Diode Having an Enhanced Defect Concentration Level and M...

Avalanche Diode Having an Enhanced Defect Concentration Level and M...

Avalanche Diode Having an Enhanced Defect Concentration Level and M...

Lateral Bipolar Transistor with Additional ESD Implant

ESD/EOS Performance by Introduction of Defects

ESD protection device and method

Electronic component and a system and method for producing an elect...

Lateral bipolar transistor with additional ESD implant

Circuit for protecting integrated circuits against electrostatic di...

Transistor comprising fill areas in the source drain and/or drain r...

ESD protective circuit with collector-current-controlled triggering...

Method for determining an ESD/latch-up strength of an integrated ci...

Operating method for a semiconductor component

Method and device for testing the ESD resistance of a semiconductor...

Transistor with ESD protection