Martin Zadrazil

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Brno, CZ

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope and method of use thereof
- Patent number 10,504,694
- Issue date Dec 10, 2019
- TESCAN Brno, s.r.o.
- Jaroslav Jiruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scintillation detection unit for the detection of back-scattered el...
- Patent number 8,779,368
- Issue date Jul 15, 2014
- Tescan Orsay Holding, A.S.
- Martin Zadrazil
- G01 - MEASURING TESTING
Information Patent Grant
Secondary electron detector, especially in a scanning electron micr...
- Patent number 7,193,222
- Issue date Mar 20, 2007
- Tescan s.r.o.
- Marcus Jacka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Scanning Electron Microscope and Method of Use Thereof
- Publication number 20170338078
- Publication date Nov 23, 2017
- TESCAN Brno, s.r.o.
- Jaroslav Jiruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THE SCINTILLATION DETECTION UNIT FOR THE DETECTION OF BACK-SCATTERE...
- Publication number 20130187055
- Publication date Jul 25, 2013
- Crytur Spol S.R.O.
- Martin Zadrazil
- G01 - MEASURING TESTING