Martinus Joseph Kok

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus for measuring properties of a target structure...
- Patent number 10,101,677
- Issue date Oct 16, 2018
- ASML Netherlands B.V.
- Kim Gerard Feijen
- G01 - MEASURING TESTING
Information Patent Grant
Support structure, inspection apparatus, lithographic apparatus and...
- Patent number 8,922,755
- Issue date Dec 30, 2014
- ASML Netherlands B.V.
- Olav Johannes Seijger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection method and apparatus, lithographic apparatus, lithograph...
- Patent number 8,797,509
- Issue date Aug 5, 2014
- ASML Netherlands B.V.
- Olav Johannes Seijger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection method and apparatus
- Patent number 8,773,640
- Issue date Jul 8, 2014
- ASML Netherlands B.V.
- Olav Johannes Seijger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for angular-resolved spectroscopic lithography characteri...
- Patent number 7,999,940
- Issue date Aug 16, 2011
- ASML Netherlands B.V.
- Martinus Joseph Kok
- G01 - MEASURING TESTING
Information Patent Grant
Device manufacturing method with angular-resolved spectroscopic lit...
- Patent number 7,999,943
- Issue date Aug 16, 2011
- ASML Netherlands B.V.
- Martinus Joseph Kok
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for angular-resolved spectroscopic lithography characteri...
- Patent number 7,659,988
- Issue date Feb 9, 2010
- ASML Netherlands B.V.
- Martinus Joseph Kok
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Inspection Apparatus for Measuring Properties of a Target Structure...
- Publication number 20160291479
- Publication date Oct 6, 2016
- ASML NETHERLANDS B.V.
- Kim Gerard FEIJEN
- G02 - OPTICS
Information Patent Application
Inspection Method and Apparatus
- Publication number 20110176123
- Publication date Jul 21, 2011
- ASML Netherlands B.V.
- Olav Seijger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection Method and Apparatus, Lithographic Apparatus, Lithograph...
- Publication number 20110141449
- Publication date Jun 16, 2011
- ASML NETHERLANDS B.V.
- Olav Seijger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Support Structure, Inspection Apparatus, Lithographic Apparatus and...
- Publication number 20110109896
- Publication date May 12, 2011
- ASML NETHERLANDS B.V.
- Olav Johannes Seijger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus for Angular-Resolved Spectroscopic Lithography Characteri...
- Publication number 20100220308
- Publication date Sep 2, 2010
- ASML NETHERLANDS B.V.
- Martinus Joseph Kok
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for angular-resolved spectroscopic lithography characteri...
- Publication number 20080266560
- Publication date Oct 30, 2008
- ASML NETHERLANDS B.V.
- Martinus Joseph Kok
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for angular-resolved spectroscopic lithography characteri...
- Publication number 20080002207
- Publication date Jan 3, 2008
- ASML NETHERLANDS B.V.
- Martinus Joseph Kok
- G01 - MEASURING TESTING

Martinus Joseph Kok

Person

Patents Grantslast 30 patents

Inspection apparatus for measuring properties of a target structure...

Support structure, inspection apparatus, lithographic apparatus and...

Inspection method and apparatus, lithographic apparatus, lithograph...

Inspection method and apparatus

Apparatus for angular-resolved spectroscopic lithography characteri...

Device manufacturing method with angular-resolved spectroscopic lit...

Apparatus for angular-resolved spectroscopic lithography characteri...

Patents Applicationslast 30 patents

Inspection Apparatus for Measuring Properties of a Target Structure...

Inspection Method and Apparatus

Inspection Method and Apparatus, Lithographic Apparatus, Lithograph...

Support Structure, Inspection Apparatus, Lithographic Apparatus and...

Apparatus for Angular-Resolved Spectroscopic Lithography Characteri...

Apparatus for angular-resolved spectroscopic lithography characteri...

Apparatus for angular-resolved spectroscopic lithography characteri...